Abstract:
PROBLEM TO BE SOLVED: To provide a light-emitting element having high internal quantum efficiency and superior reliability. SOLUTION: The light-emitting element has an electron barrier layer 16 between an active layer 15 made of ZnSeTe or BeZnSeTe and a second guide layer 17 made of an MgSe/BeZnSeTe superlattice. The electron barrier layer 16 includes an MgBeZnSeTe single layer or the MgSe/BeZnTe superlattice, and has a composition ratio, where the lower end of the conductor of the electron barrier layer 16 becomes a level higher than that of the lower end of the conduction band of the active layer 15. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a highly practical semiconductor laser which emits light from yellow to green which enables the structure crystal of a laser structure manufactured readily at high quality by providing the laser structure which can obtain room-temperature continuous oscillation while keeping high reliability. SOLUTION: The structure has an n-type clad layer, an optical guide layer, an active layer, an optical guide layer and a p-type clad layer on an InP substrate. The active layer has a layer constituted of a II-VI compound semiconductor mixed crystal comprising Be. At least one layer of the n-type clad layer, the optical guide layer and the p-type clad layer has a layer constituted of the same element as the II-VI compound semiconductor mixed crystal comprising Be of the active layer. The layer is constituted of a superlattice structure whose well layer is a mixed crystal of a composition of Be whose composition variation is within ±30% when compared to the composition of Be of the II-VI compound semiconductor mixed crystal of the active layer. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To prevent deterioration of a nitride-based group III-V compound semiconductor layer, containing In and to improve the quality of the nitride-based group III-V compound semiconductor layer that does not contain In, when the nitride-based group III-V compound semiconductor layer that does not contain In is grown on the nitride-based group III-V compound semiconductor layer containing In, such as GaInN layer at a higher growth temperature than that of the latter layer. SOLUTION: A protective film composed of AlGaN is grown on the nitride-based group III-V compound semiconductor layer, containing In at a growth temperature almost equal to or lower than that of the semiconductor layer thereof, and the nitride-based III-V compound semiconductor layer that does not contain In is grown thereon. Here, N 2 is used as the carrier gas, when the nitride-based group III-V compound semiconductor layer containing In and the protecting film are grown, and a mixed gas of H 2 and N 2 is used for the carrier gas, when the nitride-based group III-V compound semiconductor layer that does not contain In is grown. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a process for manufacturing a semiconductor laser employing a nitride based III-V compound semiconductor in which the oscillation of a high order mode can be suppressed at a high output by controlling a transverse mode stably while ensuring excellent heat dissipation properties. SOLUTION: In a semiconductor laser employing a nitride based III-V compound semiconductor and having a ridge-like stripe, both sides of the ridge are buried with burying semiconductor layers, e.g. AlGaN burying layers 20, each composed at least partially of a non-single crystal, e.g. polycrystalline, nitride based III-V compound semiconductor. The burying semiconductor layer is grown in temperatures of 520-760°C, for example. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor element that is provided with a light emission layer to efficiently emit a light having a wavelength in blue or green color band. SOLUTION: This method is used to manufacture a semiconductor element by a metal organic vapor phase growth method (MOCVD method). For example, the growth step for an GaInN layer when the GaInN layer is grown as an active layer of an LD includes first and second steps. The first step is for the supply of all kinds of material, wherein the temperature of a substrate is set at about 650°C and an ammonium, a Ga material and an In material are respectively supplied to a reaction tube at specified rates, 0.67 μmol/min, 9.06 μmol/min and 11.13 μmol/min for 5 seconds to grow the GaInN layer. Next, in the second step, while an ammonium and a carrier gas are supplied to the reaction tube for two seconds, the supply of the Ga material and In material is interrupted. A cycle of the first step of 5 seconds and the second step of two seconds is repeated until the film thickness reaches a predetermined value. COPYRIGHT: (C)2004,JPO
Abstract:
PURPOSE:To form effective traps in a photochromic material go that the density and energy levels can be arbitrarily controlled by artificially adding materials having different crystalline structures, lattice constants and energy band levels. CONSTITUTION:This photochromic material has a photochromic layer 3 having such a structure that each one or more layers of at least first material layers and second material layers are laminated on a substrate 11. At least one of these materials contain a material showing photochromism. On the interface of the material layers, 1 and 2, an irregular structure is produced due to lattice defects due to the structure and size (lattice const.) of the crystal or molecules of in the layers 1 and 2, due to intrusion of atoms or ions to among the lattice points, or due to strain of the lattice or molecules. This structure can be used as a trap for electrons in the photochromic reaction. Thereby, by selecting materials and thickness, the crystalline structure and lattice const. can be artificially controlled so that trapping in photochromic layer 3 can be controlled.
Abstract:
PURPOSE:To dissolve the problem of the time deviation between a reproducing beam and light emission detection and the problem of reproducing resolution by bisecting the light emission from a recording medium by the excitation by a reproducing wavelength beam with a diffraction grating and detecting them with plural photodetectors. CONSTITUTION:A reproducing beam irradiates a prescribed position on the recording medium 1. A light emission beam, that is, the beam to be detected distributed over a prescribed wavelength area emitted by excitation with the irradiation of the reproducing beam goes to a beam splitter or a wavelength selection mirror 14 through an objective lens 15, and thus, is branched from an optical path from a light source 11, and e.g. goes straight on, and is converged on an aperture 4 of a light shielding body 16 by a condenser lens 25 to be sent to the diffraction grating 2 through a collimeter lens 17 through the aperture 4. Thus, the beam to be detected is light divided according to the wavelength area, e.g. wavelengths of lambda1-lambdan of the beam to be detected, that is, the light emission from the recording medium 1, and go to positions different from each other respectively according to wavelengths through the condenser lens 35, and are received by respective corresponding photodetectors 3 beforehand arranged on these positions different from each other to be detected.
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor device which can suppress the reductions of its electric characteristics and the regularity and stability of its crystal structure by the diffusion of impurities. SOLUTION: In the semiconductor device, a buffer layer 11, a lower cladding layer 12, a lower guiding layer 13, an active layer 14, an upper guiding layer 15, an upper cladding layer 16, and a contact layer 17 are laminated on a substrate 10 in this order. Further, by using as a set a lamination structure constituted by laminating a diffusion suppressing layer 16A, a first upper cladding layer 16B, a diffusion suppressing layer 16C, and a second upper cladding layer 16D from the side of the substrate 10 in this order, the upper cladding layer 16 is so formed as to laminate a plural sets of lamination structures. Moreover, the diffusion suppressing layers 16A, 16C include as their main components compound semiconductors of groups II-VI wherefrom Mg, Te are excluded. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor element with high reliability, a long life, and excellent light-emitting characteristics by using another material in a p-type clad layer. SOLUTION: A buffer layer 11, a lower clad layer 12, a lower guide layer 13, an active layer 14, an upper guide layer 15, an upper clad layer 16, and a contact layer 17 are provided in this order on a surface of a substrate 10 made of InP. The upper clad layer 16 has a laminated structure formed by alternately stacking a first upper clad layer 16A mainly composed of Be x1 Mg x2 Zn x3 Te (0 x4 Mg x5 Zn x6 Te (0
Abstract:
PROBLEM TO BE SOLVED: To provide a low-cost laser module capable of reducing the influence of return light. SOLUTION: A polarization beam splitter 5 for transmitting a polarized light component, having a specific plane of polarization out of beams exiting from a semiconductor laser 2, is arranged in an optical path L between the semiconductor laser 2 and an optical fiber 3. The light, reflected on the exit end 3b of the optical fiber 3 and light, reflected on a target 9 to be irradiated are turned into a return light N that is propagated through the optical fiber 3. The plane of polarization of the return light N is not maintained due to the propagation through the optical fiber 3, and light components having planes of polarization in various directions are mixed. Consequently, the return light N, having a plane of polarization different from that of laser light S made to exit from the semiconductor laser 2, is reflected at the reflection surface 5a of the polarization beam splitter 5 and will not reach the semiconductor laser 2. COPYRIGHT: (C)2007,JPO&INPIT