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公开(公告)号：EP1653743A4
公开(公告)日：2009-01-14
申请号：EP04702068
申请日：2004-01-14
Applicant: SONY CORP
Inventor： FUJITA HIRONORI , MASE MIKIKO , HAMA HIDEKI , HASEGAWA HIROYUKI
IPC: H04N7/18 , G06T1/00 , G06T7/20 , G08B13/194 , H04N5/225 , H04N5/76 , H04N5/77 , H04N5/781 , H04N5/91 , H04N5/915 , H04N9/804 , H04N9/82
CPC classification number: G06T1/00 , G06T2200/32 , G08B13/19602 , G08B13/19606 , G08B13/19671 , G08B13/1968 , G08B13/19682 , G08B13/19689 , H04N5/23238 , H04N5/76 , H04N5/77 , H04N5/781 , H04N7/181 , H04N9/8047 , H04N9/8205
Abstract: A monitoring device for monitoring a panorama image obtained by imaging an imaging range by successively changing the imaging direction. According to the panorama image, each unit image is successively recorded in a server (53). The luminance level for each primary color component is compared between one unit image selected from the server and a unit image of the same imaging direction recorded earlier than that unit image. According to the comparison result, predetermined information is displayed via a display (6) for each unit image constituting the panorama image, thereby calling the user attention.
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2.发明专利Image display apparatus, image display control method, program, and monitoring camera system 审中-公开图像显示装置，图像显示控制方法，程序和监视摄像机系统
公开(公告)号：JP2008244946A
公开(公告)日：2008-10-09
申请号：JP2007083520
申请日：2007-03-28
Inventor： FUJITA HIRONORI , HAMA HIDEKI , BABA HIROMITSU , MOCHIZUKI MICHIE
Abstract: PROBLEM TO BE SOLVED: To allow a user to easily acquire a detailed information of a prescribed position on a picked-up image.
SOLUTION: A monitoring portion 106 receives data of each image obtained by sequentially imaging by a panorama camera unit portion 101, generates image data of a panoramic image by connecting each image, and displays the panoramic image on a display. A data base 107 has map information and photograph (aerial and satellite) information, corresponding to a photographic subject of a wide area to be imaged by the panorama camera unit portion 101 and also has information corresponding to the panoramic image, the map and the aerial photograph which are displayed on the monitoring portion 106. When the prescribed position on the panorama image being displayed on the display is designated, the map information or the photograph information, corresponding to the designated position is read from the data base 107, and the image by the map information or the photograph information is displayed on the display. Furthermore, positional information, such as a longitude and a latitude of the designated position and an address, are displayed on the image.
COPYRIGHT: (C)2009,JPO&INPITAbstract translation: 要解决的问题：允许用户容易地获取拾取图像上的规定位置的详细信息。 解决方案：监视部分106接收通过全景照相机单元部分101顺序成像获得的每个图像的数据，通过连接每个图像生成全景图像的图像数据，并在显示器上显示全景图像。 数据库107具有与由全景摄像机单元部分101成像的广域的拍摄对象对应的地图信息和照片（空中和卫星）信息，并且还具有与全景图像，地图和天线对应的信息 显示在监视部分106上的照片。当指定显示在全景图像上的规定位置时，从数据库107读取对应于指定位置的地图信息或照片信息，并且图像 通过地图信息或照片信息显示在显示器上。 此外，在图像上显示诸如指定位置的经度和纬度的位置信息和地址。 版权所有（C）2009，JPO＆INPIT
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3.发明专利
公开(公告)号：JP2004221386A
公开(公告)日：2004-08-05
申请号：JP2003008025
申请日：2003-01-16
Inventor： OKAWACHI HIROKI , HATTORI TADASHI , TAKAYAMA MASATO , FUJITA HIRONORI , AKI YUICHI , TAKEDA MINORU
IPC: H01L21/66 , H01J37/16 , H01J37/18 , H01J37/28 , H01L21/027 , H01L21/50 , H01L21/68 , H01L21/683 , H01L23/52
Abstract: PROBLEM TO BE SOLVED: To provide an inspection and measurement device of a particulate semiconductor and an inspection and measurement method of the particulate semiconductor in which a spherical semiconductor can be held in non-contact separating the vacuum space of a specific gap without using a large-scaled clean room. SOLUTION: The inspection and measurement device 100 of the particulate semiconductor comprises a local vacuum mechanism 5 for holding a particular semiconductor 3 in non-contact separating the vacuum space of the specific gap. The local vacuum mechanism 5 is constituted of a curved surface 15 recessed in the surface of a block body 22 to oppose an external plane of the particular semiconductor 3, an electron beam path perforated in the block body 22 to open to the curved surface 15, an exhaust port 19 provided in the curved surface 15 in its circumferential direction about the electron beam path, and an admission port 21 provided outside the exhaust port 19 in its circumferential direction about the electron beam path. COPYRIGHT: (C)2004,JPO&NCIPI
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公开(公告)号：JPH09282658A
公开(公告)日：1997-10-31
申请号：JP11195896
申请日：1996-04-08
Applicant: SONY CORP
Inventor： MIYAGAWA AKIRA , INAGAKI MASAOMI , FUJITA HIRONORI
Abstract: PROBLEM TO BE SOLVED: To improve a defect detecting accuracy. SOLUTION: A comarator 5 compares an HF signal (a reflected light quantity from a disk surface) with the voltage value (reference reflected light quantity) of a power source for reference voltage generation 6 and outputs the difference signal between them as a reflected light fluctuation signal to a switch circuit for detection timing generation 8, which opens and closes a circuit so as to output a focus error signal only when the reflected light quantity fluctuation signal is equal to or larger than a prescribed value to enable ruggednesses to be measured only when the reflected light quantity from the disk surface is changed by a quantity being equal to or larger than the prescribed value.
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5.发明专利
公开(公告)号：JP2003028629A
公开(公告)日：2003-01-29
申请号：JP2001215301
申请日：2001-07-16
Inventor： FUJITA HIRONORI
IPC: G01B11/02 , G01B21/02 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To measure the dimension of a semiconductor wafer, etc., in a short time, with high precision. SOLUTION: First and second actual measurement value information inputting means 2 and 4 accept input of first and second actual measurement value information of a first semiconductor wafer. A reference value dimension calculating means 5 calculates a first dimension by simulation using the second actual measurement value information. A dimension error-related information generating means 6 generates the dimension error-related information representing the relation ship between the actual measurement value of first dimension represented by the first actual measurement value information and the acquired calculated value of first dimension. A third actual measurement value information inputting means 8 accepts input of the third actual, measurement value information of a second semiconductor wafer. A first dimension calculating means 9 calculates the first dimension of the second semiconductor wafer using the dimension error-related information generated by the dimension error-related information generating means and the third actual measurement value information.
Abstract translation: 要解决的问题：以高精度在短时间内测量半导体晶片的尺寸等。 解决方案：第一和第二实际测量值信息输入装置2和4接受第一半导体晶片的第一和第二实际测量值信息的输入。 参考值尺寸计算装置5使用第二实际测量值信息通过模拟来计算第一尺寸。 尺寸误差相关信息生成装置6生成表示由第一实际测量值信息表示的第一维度的实际测量值与获取的第一维度的计算值之间的关系的尺度误差相关信息。 第三实际测量值信息输入装置8接受第二半导体晶片的第三实际测量值信息的输入。 第一尺寸计算装置9使用由尺寸误差相关信息产生装置产生的尺寸误差相关信息和第三实际测量值信息来计算第二半导体晶片的第一尺寸。
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Patent Agency Ranking
公开(公告)号：JP2002071464A
公开(公告)日：2002-03-08
申请号：JP2000254402
申请日：2000-08-24
Applicant: SONY CORP
Inventor： FUJITA HIRONORI
Abstract: PROBLEM TO BE SOLVED: To allow a precise calibration to be performed by increasing the number of rotational angle positions of a phase plate which is a measurement target in calibration while degradation in productivity caused by the calibration is prevented, with no increase in labor for calibrating a double refraction measuring device. SOLUTION: A first measurement is performed by the double refraction measuring device with a phase plate 1 as an object to be measured. Based on the first measurement result, the phase plate 1 is calibrated for rotational angle position. A second measurement is performed by the double refraction measuring device using at least four different rotational angle positions around an optical axis of the phase plate 1. The double refraction measuring device is calibrated based on the second measurement result.
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公开(公告)号：JPH09203617A
公开(公告)日：1997-08-05
申请号：JP3142396
申请日：1996-01-24
Applicant: SONY CORP
Inventor： USUDA YUTAKA , KOBAYASHI MOTOHIRO , FUJITA HIRONORI , MIYAZAKI MITSUHIRO
Abstract: PROBLEM TO BE SOLVED: To accurately inspect a surface by condensing a laser light to a face of a substance to be inspected, detecting the defocus amount from the face, detecting the shifting amount of a shifting position based on the detected defocus amount. SOLUTION: A laser light L10 from a laser light source 46 is scanned on a face 42A to be inspected of a substance 42 to be inspected. A reflecting light L11 at the face 42A is detected by a light amount detector 48, and an intensity of the reflecting light L11 is measured. A photodetecting signal S30 in accordance with the intensity of the reflecting light L11 is sent to a digital signal- processing device 51 via an A/D conversion circuit 50. The device 51 stores a position of a substance-moving device 41 based on a positional information signal 32 supplied from the device 41 via the circuit 50. Then, a focus control device 44 sends a control signal 31 to the processing device 51 via the circuit 50. The signal 31 is subjected to phase differentiation, by which a point of inflection is detected. The shifting amount is converted into nanometers. Display image data are formed at a position on the face 42A corresponding to the positional information of the device 41 and displayed at 52.
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公开(公告)号：JPH0814868A
公开(公告)日：1996-01-19
申请号：JP14440694
申请日：1994-06-27
Applicant: SONY CORP
Inventor： MIYAGAWA AKIRA , FUJITA HIRONORI
IPC: G01B11/30 , G01N21/95 , G11B7/0037 , G11B7/085 , G11B7/09 , G11B7/26 , G11B11/105
Abstract: PURPOSE:To provide a device for inspecting the outer surface of a disc-like recording medium, which can inspect the entire surface of a data recording area under tracking control which is not affected by radial widths of lands and grooves. CONSTITUTION:An inspecting device incudes a spindle motor 1, an optical pick-up 2 and a thread motor 3. A spot side control part 4b in a signal detecting part 4 delivers an output signal to a servo part 5 so as to carry out tracking servo-control for two subbeams from the optical pick-up while the beams are irradiated onto parts in the vicinity of boundaries of a land part which is defined between grooved parts. Thus it is possible to irradiate the beams to positions where the volumes of the reflection of the two beams become minimum.
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公开(公告)号：JP2004266317A
公开(公告)日：2004-09-24
申请号：JP2003011614
申请日：2003-01-20
Inventor： FUJITA HIRONORI , MASE MIKIKO , HAMA HIDEKI , HASEGAWA HIROYUKI
IPC: G06T1/00 , G06T7/20 , G08B13/194 , H04N5/225 , H04N5/76 , H04N5/77 , H04N5/781 , H04N5/915 , H04N7/18 , H04N9/804 , H04N9/82
CPC classification number: G06T1/00 , G06T2200/32 , G08B13/19602 , G08B13/19606 , G08B13/19671 , G08B13/1968 , G08B13/19682 , G08B13/19689 , H04N5/23238 , H04N5/76 , H04N5/77 , H04N5/781 , H04N7/181 , H04N9/8047 , H04N9/8205
Abstract: PROBLEM TO BE SOLVED: To reduce the labor burden on a monitoring person, and to rapidly and accurately detect a change in the state of a vast photographing range.
SOLUTION: A panorama image obtained by picking up a photographing range while sequentially changing a photographing direction is sequentially recorded in a server 53 for each unit image, and the luminance level of a single unit image selected from the server 53 is compared with that of a unit image in the same photographing direction which has been recorded prior to the unit image for each primary color. Based on the result of comparison, predetermined information is displayed via a display 6 for each unit image constituting the panorama image to urge a user to pay attention.
COPYRIGHT: (C)2004,JPO&NCIPI-
公开(公告)号：JP2004228711A
公开(公告)日：2004-08-12
申请号：JP2003011613
申请日：2003-01-20
Inventor： FUJITA HIRONORI , KUREBAYASHI MASAAKI , KUROTANI TAKEYOSHI , HAMA HIDEKI , HASEGAWA HIROYUKI
Abstract: PROBLEM TO BE SOLVED: To easily detect a change in a state and a photographing point day and night. SOLUTION: A plurality of panoramic images obtained by imaging a photographing area by sequentially changing a photographing direction are generated at different times or by different focal distances. A server 53 records the plurality of panoramic images and conditions. The plurality of the panoramic images read from the server 53 are combined according to a combination ratio set by a user and displayed on a display apparatus 6. Further, a display image to display prescribed information is furthermore combined with the panoramic images to prevent forgery of the composite image. COPYRIGHT: (C)2004,JPO&NCIPI
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