公开(公告)号：WO2020013024A1

公开(公告)日：2020-01-16

申请号：PCT/JP2019/026237

申请日：2019-07-02

Applicant: SONY CORPORATION

Inventor： TAKASHIMA Masatoshi ,  DATE Hideki ,  KITAMURA Yu

IPC: G06K9/00 ,  G06K9/20

Abstract: Selection of an evaluation index based upon statistical values of respective evaluation indices is disclosed. In one example, an information processing apparatus comprises an evaluation index unit that determines a plurality of evaluation indices on a basis of imaging data obtained by imaging a subject, wherein the evaluation indices are respectively based upon different wavelength component combinations of the imaging data. An evaluation value unit determines an evaluation value based on a statistical value of each of the evaluation indices, for each of the evaluation indices. A selection unit then determines a selected evaluation index from the evaluation indices on a basis of the evaluation values.

公开(公告)号：EP3315928A1

公开(公告)日：2018-05-02

申请号：EP16814186.9

申请日：2016-06-10

Applicant: Sony Corporation

Inventor： TAKASHIMA Masatoshi ,  MURAKAMI Yoshihiro ,  MORI Hiroshi

IPC: G01J3/51 ,  A01G7/00 ,  G01N21/27

CPC classification number: G01N21/255 ,  A01G7/00 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/51 ,  G01N21/27 ,  G01N21/274 ,  G01N33/0098 ,  G01N2021/8466 ,  G01N2201/0616

Abstract: The present disclosure relates to an inspection apparatus, a sensing apparatus, a sensitivity control apparatus, an inspection method, and a program that perform inspection with improved accuracy. The inspection apparatus includes a detection section for detecting a plurality of different wavelength region components of ambient light reflected from an inspection target to be inspected, and a control section for controlling the sensitivity of each of the different wavelength region components. The control section controls the sensitivity by calculating a histogram indicating the detection level in every wavelength region of light reflected from the inspection target that is detected by the detection section, and determining, based on histograms of particular spectroscopic components, whether or not the sensitivity is properly set for the detection section. The present technology is applicable, for example, to an inspection apparatus that inspects vegetation.

Abstract translation: 本公开涉及以更高的精度执行检查的检查装置，感测装置，灵敏度控制装置，检查方法和程序。 所述检查装置包括要被检查用于检测多个从检查对象反射的环境光的不同的波长区域的成分的检测部，以及用于控制各个不同的波长区域的分量的灵敏度的控制部。 所述控制部通过计算的直方图指示在由所述检测部检测从所述检查对象反射的光的每个波长区域中的检测电平，并确定，基于特定的光谱分量的直方图，灵敏度是否是灵敏度 正确设置检测部分。 例如，本技术可应用于检查植被的检查设备。

公开(公告)号：EP3833944A1

公开(公告)日：2021-06-16

申请号：EP19752278.2

申请日：2019-07-23

Applicant: Sony Corporation

Inventor： TAKASHIMA Masatoshi

IPC: G01J1/04 ,  G01J1/42 ,  G01J1/02 ,  G01N21/27 ,  G01N21/84

公开(公告)号：EP3821368A1

公开(公告)日：2021-05-19

申请号：EP19746194.0

申请日：2019-07-02

Applicant: Sony Corporation

Inventor： TAKASHIMA Masatoshi ,  DATE Hideki ,  KITAMURA Yu

IPC: G06K9/00 ,  G06K9/20

公开(公告)号：EP3477279A1

公开(公告)日：2019-05-01

申请号：EP17815225.2

申请日：2017-06-12

Applicant: Sony Corporation

Inventor： TAKASHIMA Masatoshi

IPC: G01N21/27 ,  A01G7/00 ,  G06T1/00

Abstract: The present technology relates to a sensing system, a sensing method, and a sensing device which are capable of performing measurement with higher accuracy.
A sensing system is configured such that a plurality of reference reflection regions having a reflectance corresponding to an inspection target are prepared for each wavelength band which is a target for sensing of the inspection target as reference reflection regions, and is configured to sense the reference reflection region having a reflectance corresponding to the inspection target for each wavelength band which is a target for sensing of the inspection target at the time of sensing a region including the inspection target and the reference reflection region. The present technology can be applied to a system for measuring a vegetation index such as a normalized difference vegetation index (NDVI).