HIGH SPEED DIFFERENTIAL DATA SAMPLING CIRCUIT

    公开(公告)号:JP2003264454A

    公开(公告)日:2003-09-19

    申请号:JP2002372307

    申请日:2002-12-24

    Abstract: PROBLEM TO BE SOLVED: To provide an electric signal sampling circuit with enhanced accuracy. SOLUTION: A differential data sampling circuit is provided for sampling an input signal line with precise timing so as to provide reduced sensitivity to noise. The differential data sampling circuit includes a latch circuit for initially sampling a differential data signal in response to a first strobe signal. The latch circuit operates to rapidly capture the signal level present on the input signal line. The output of the latch circuit is sampled by a strobe circuit in order to sample and hold the output of the latch circuit based on a second strobe signal. In preferred embodiments, the latch circuit has a high input impedance. A digital data receiver including such a differential data sampling circuit is also provided. COPYRIGHT: (C)2003,JPO

    2.
    发明专利
    未知

    公开(公告)号:DE60204631D1

    公开(公告)日:2005-07-21

    申请号:DE60204631

    申请日:2002-05-28

    Abstract: A closed loop delay line system (700) includes a phase lock loop that provides a phase lock output signal (715). A delay line (702) includes a clock input, a delay line output, and a delay line bias input. A bias signal provided to the delay line bias input (727) adjusts the speed of the delay line (702). A phase detector (720) compares phase between a first timing signal input (704) and the delay line output (706). A bias adjust circuit (726) mixes the phase compare output signal (725) and the phase lock output signal (715) to provide a combination bias signal (727) to the delay line (702). Additionally, the relative timing position of strobe outputs (734) from the delay line (702) can be individually adjusted.

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