公开(公告)号：DE60232817D1

公开(公告)日：2009-08-13

申请号：DE60232817

申请日：2002-10-28

Applicant: STFC SCIENCE & TECHNOLOGY

Inventor： LEWIS ROBERT

IPC: G01N23/04 ,  A61B6/00 ,  G01N23/207

Abstract: Apparatus for imaging an object ( 13 ) irradiated with an X-ray beam ( 12 ) by detecting a transmitted X-ray beam transmitted through the object. A crystal analyser ( 15 ) receives the transmitted X-ray beam and emits a first diffracted X-ray beam to a detector assembly ( 14 ) comprising first and second X-ray detectors ( 16 and 17 ). The first detector ( 16 ) is a monochromating semiconductor detector which detects a first portion of the first diffracted X-ray beam to generate first image data, and which diffracts a second portion of the first diffracted beam to the second detector ( 17 ) which generates second image data. Image processing means ( 18 ) are provided for combining the first and second image data to derive a refraction image and an absorption image of the object ( 13 ).