公开(公告)号：US20240405111A1

公开(公告)日：2024-12-05

申请号：US18204009

申请日：2023-05-31

Applicant: STMicroelectronics International N.V.

Inventor： Christophe MAURIAC ,  Laurent SIEGERT

IPC: H01L29/747

Abstract: A TRIAC features first and second main-terminal contacts, and a gate terminal contact, with multiple semiconductor regions stacked along a first-axis and extending laterally along an intersecting second-axis that defines first, second, and middle regions. The semiconductor regions include a third N-type region overlying the second main-terminal contact, a second P-type region overlying the second main-terminal contact, a second N-type region overlying the second P-type region, a first P-type region overlying the second N-type region, a first N-type region partially overlying the first P-type region, a fourth N-type region partially overlying the first P-type region, and a fifth N-type region partially overlying the first P-type region. The first main-terminal contact is partly on the first N-type region in the first region and on the first P-type region in the second region, while the gate terminal contact is partly on both the first P-type region and the fourth N-type region.