Scan latch circuit
    1.
    发明公开
    Scan latch circuit 有权
    扫描锁存电路

    公开(公告)号:EP1081498A1

    公开(公告)日:2001-03-07

    申请号:EP00302835.4

    申请日:2000-04-04

    CPC classification number: G01R31/318541

    Abstract: A circuit is described which allows a scan latch to selectively pass inputs derived from either of two test outputs, e.g. scan test and built-in self-test data, but which does not apply an added delay to a data path when this is instead selected.

    Abstract translation: 描述了一种电路,其允许扫描锁存器选择性地通过来自两个测试输出之一的输入,例如, 扫描测试和内置的自测数据,但在选择此选项时不会对数据路径添加延迟。

    Current reference circuit
    5.
    发明公开
    Current reference circuit 有权
    电流参考电路

    公开(公告)号:EP1079294A1

    公开(公告)日:2001-02-28

    申请号:EP00303967.4

    申请日:2000-05-11

    CPC classification number: G05F3/262

    Abstract: An integrated current reference circuit uses two current mirror circuits, in which one of the transistors of one of the current mirrors has a back gate connection to the power rail, the drain-source path being connected to the power rail via a voltage offset element.

    Abstract translation: 集成电流参考电路使用两个电流镜电路,其中一个电流镜的一个晶体管具有到电源轨的背栅连接,漏源通路经由电压偏移元件连接到电源轨。

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