Abstract:
A readout circuit for an image sensing pixel array is disclosed, which is arranged to perform correlated double sampling and comprises readout circuitry which is capable of learning its own internal offset and the offset of both its inputs. In the process of correlated double sampling, one of two sampling capacitors can be made smaller, as the thermal noise it creates is learned. The reduction of size of the appropriate sampling capacitor enables the size of a multiplexer column to be reduced without affecting its noise contribution.
Abstract:
An image sensor has a per-column ADC arrangement including first and second capacitors for correlated double sampling, and a comparator circuit. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential amplifier having one input connected to the junction of the two capacitors and another input connected to a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential amplifier as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast.
Abstract:
An image sensor has a per-column ADC arrangement including first and second capacitors for correlated double sampling, and a comparator circuit. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential amplifier having one input connected to the junction of the two capacitors and another input connected to a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential amplifier as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast.
Abstract:
A rolling blade exposure system is disclosed where odd rows of a pixel array are read out with a short exposure time and even rows are read out at a long exposure time. Each pair of sampled rows are stitched together before to form a single output line. The resultant image is then formed from the output lines. The stitching process ensures that the resultant image has a wide dynamic range. This is achieved at the expense of a loss of resolution, but this loss is acceptable for certain applications.
Abstract:
An image sensor is disclosed having an array of pixels arranged in rows and columns. A reference current source provides the reference current to a transistor forming one half of a current mirror. Each column has a current source which forms the other half of a current mirror. A switch is provided to selectively connect a resistive means between ground and the transistor. When the resistive means is connected, the transistor is starved of gate-source voltage which reduces the current supplied by each current source.
Abstract:
An image sensor is described, which makes use of a distributed amplifier (10). The distributed amplifier (10) has its non-inverting input (22) provided by a pixel amplifier transistor (18), and its inverting input (20) and output (30) provided in the pixel's column circuitry (58). The distributed amplifier (10) is directly integrated with the image sensor's ADC circuit, and sampling and autozero are performed in a single step, thus reducing the number of noise contributions made by the components of the image sensor's readout chain.
Abstract:
Image sensor quality can be affected by power supply ripple caused by different loads on the power supply or through electromagnetic interference affecting the image sensor reference supplies. Improved reference voltage supplies are disclosed, minimising the effects of power supply ripple through Ahuja compensation and utilising parasitic capacitance.