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1.发明授权A method and device for testing of configuration memory cells in programmable logic devices (PLDS) 有权测试的方法和装置用于在可编程逻辑器件配置存储器单元（PLD）的
公开(公告)号：EP1363132B1
公开(公告)日：2007-09-05
申请号：EP03010587.8
申请日：2003-05-12
Applicant: STMicroelectronics Pvt. Ltd
Inventor： Pathak, Shalini , Swami, Parvesh
IPC: G01R31/3185 , G11C29/00 , G06F11/10
CPC classification number: G11C29/025 , G01R31/318516 , G11C29/02 , G11C29/12
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2.发明公开A method and device for testing of configuration memory cells in programmable logic devices (PLDS) 有权测试的方法和装置用于在可编程逻辑器件配置存储器单元（PLD）的
公开(公告)号：EP1363132A3
公开(公告)日：2004-02-04
申请号：EP03010587.8
申请日：2003-05-12
Applicant: STMicroelectronics Pvt. Ltd
Inventor： Pathak, Shalini , Swami, Parvesh
IPC: G01R31/3185 , G11C29/00 , G06F11/10
CPC classification number: G11C29/025 , G01R31/318516 , G11C29/02 , G11C29/12
Abstract: A Programmable Logic Device (PLD) incorporating the ability to test the configuration memory either independently or during configuration, comprising a selector for selecting a particular column or row of the configuration memory array, an input data store for storing configuration data required to be stored in the selected column or row, or test data for testing the selected column or row, an output data store for storing the output from the selected column or row, and test logic that provides control signals for verifying the correct operation of the data lines of the configuration memory array without disturbing the data stored in the memory array.
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3.发明公开A method and device for testing of configuration memory cells in programmable logic devices (PLDS) 有权测试的方法和装置用于在可编程逻辑器件配置存储器单元（PLD）的
公开(公告)号：EP1363132A2
公开(公告)日：2003-11-19
申请号：EP03010587.8
申请日：2003-05-12
Applicant: STMicroelectronics Pvt. Ltd
Inventor： Pathak, Shalini , Swami, Parvesh
IPC: G01R31/3185
CPC classification number: G11C29/025 , G01R31/318516 , G11C29/02 , G11C29/12
Abstract: A Programmable Logic Device (PLD) incorporating the ability to test the configuration memory either independently or during configuration, comprising a selector for selecting a particular column or row of the configuration memory array, an input data store for storing configuration data required to be stored in the selected column or row, or test data for testing the selected column or row, an output data store for storing the output from the selected column or row, and test logic that provides control signals for verifying the correct operation of the data lines of the configuration memory array without disturbing the data stored in the memory array.
Abstract translation: 一种可编程逻辑器件（PLD）包含以测试配置存储器要么unabhängig或配置过程中，在输入数据存储单元选择配置存储器阵列的特定列或行用于存储需要被存储在配置数据，其包括选择器的能力 用于测试所选择的行或列来输出数据存储用于从所选的列或行，和测试逻辑存储输出没选择的列或行，或测试数据提供控制信号用于验证正确的操作的数据线的 配置存储器阵列，而不会干扰存储在存储器阵列中的数据。
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