公开(公告)号：EP3961229A1

公开(公告)日：2022-03-02

申请号：EP21190380.2

申请日：2021-08-09

Applicant: STMicroelectronics S.r.l.

Inventor： DONDINI, Mirko ,  CRISAFULLI, Roberto ,  TRECARICHI, Calogero Andrea ,  RANDAZZO, Vincenzo

IPC: G01R31/3167 ,  G01R31/317

Abstract: An electronic device (10) such as an e-fuse comprises analog circuitry configured to be set to one or more self-test configurations. To that effect the device comprises self-test controller circuitry (12) in turn comprising:
an analog configuration and sensing circuit (16, 162) configured to set the analog circuitry to one or more self-test configurations and to sense test signals occurring in the analog circuitry set to such self-test configurations,
a data acquisition circuit (18, 182) configured to acquire and convert to digital the test signals sensed at the analog sensing circuit, and
a fault event detection circuit (22, 222) configured to check the test signals converted to digital against reference parameters.
The device (10) comprises integrated therein a self-test controller (12) configured to control parts or stages of the device to configure circuits, acquire data and control test execution under the coordination of a test sequencer (120).