公开(公告)号：US12135668B2

公开(公告)日：2024-11-05

申请号：US18056012

申请日：2022-11-16

Applicant: STMicroelectronics S.r.l.

Inventor： Marco Castellano ,  Francesco Bruni ,  Luca Gandolfi ,  Marco Leo

IPC: G06F3/00 ,  G06F13/40

Abstract: A processor includes a synchronous circuit including a plurality of processing stages, wherein each processing stage includes a selection data bus; and an asynchronous circuit coupled to each selection data bus, wherein the asynchronous circuit includes an asynchronous state machine whose states correspond to a process phase or a plurality of circuits, wherein the asynchronous circuit further includes a selectable delay circuit whose delay is determined by a present state of the asynchronous state machine, and wherein the asynchronous circuit is configured for generating a plurality of processing stage clock signals each having a selectable delay provided by the selectable delay circuit.

公开(公告)号：US12299596B2

公开(公告)日：2025-05-13

申请号：US17360977

申请日：2021-06-28

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Luca Gandolfi ,  Marco Castellano ,  Marco Leo

IPC: G06N5/04 ,  G01C19/5712 ,  G01P1/00 ,  G01P15/08 ,  G06N20/00

Abstract: System, method, and circuitry for utilizing sequential input inertial sensor data to calculate recursive features for training a machine learning algorithm or for classifying the data as a known class. The recursive feature values of a current data sample are calculating based on comparisons between the current data sample value and previous recursive feature values. The recursive features include a recursive maximum, recursive minimum, recursive peak to peak, recursive average, recursive root mean square, and recursive variance.

公开(公告)号：US20240175754A1

公开(公告)日：2024-05-30

申请号：US18060501

申请日：2022-11-30

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Luca Gandolfi ,  Ugo Garozzo

IPC: G01J5/02 ,  G01J5/24

CPC classification number: G01J5/027 ,  G01J5/24

Abstract: A sensor device includes an infrared sensor configured to generate sensor data. The sensor device also includes a configurable digital analysis block. The configurable digital analysis block is configured to generate classification data based on the sensor data. The configurable digital analysis block includes a plurality of selectable analysis blocks that can be selectively included in generating the classification data.