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1.发明授权Method and circuit for testing the presence of multiple supply voltages in an integrated circuit 有权的方法和电路，用于测试在集成电路的多个电源电压的存在
公开(公告)号：EP1083436B1
公开(公告)日：2005-06-01
申请号：EP99830559.3
申请日：1999-09-08
Applicant: STMicroelectronics S.r.l.
Inventor： Garbelli, Luigi Eugenio , Luciano, Guiseppe , Portaluri, Salvatore
IPC: G01R31/40
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2.发明公开Method and circuit for testing the presence of multiple supply voltages in an integrated circuit 有权的方法和电路，用于测试在集成电路的多个电源电压的存在
公开(公告)号：EP1083436A1
公开(公告)日：2001-03-14
申请号：EP99830559.3
申请日：1999-09-08
Applicant: STMicroelectronics S.r.l.
Inventor： Garbelli, Luigi Eugenio , Luciano, Guiseppe , Portaluri, Salvatore
IPC: G01R31/40
Abstract: The monitoring of multiple supply voltages of an IC, part of which are externally provided and part of which, of different voltage and sign, are internally generated (12V, 5V, 3.3V, 2.5V, -5V), consisting in generating a logic signal (NPOR) monitoring the correctness of all said supply voltages after an initial soft start phase of the turn-on process, is done by using a single external capacitor (C) connected to a pin of the integrated circuit.
Abstract translation: 的IC的多个电源电压，其中一部分的不同的电压和标志的是外部提供的并且其的一部分，所述的监测，在内部产生（12V，5V，3.3V，2.5V，5V）在产生逻辑由......组成 信号（NPOR）监控所有所述电源电压的正确性在导通过程的初始软启动阶段之后，通过使用连接到集成电路的引脚的单个外部电容器（C）进行。
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