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    Improved built-in self-test method and system
    1.
    发明公开
    Improved built-in self-test method and system 审中-公开
    Verbesserte eingebaute Selbsttestmethode und System

    公开(公告)号：EP1724788A1

    公开(公告)日：2006-11-22

    申请号：EP05104183.8

    申请日：2005-05-18

    Applicant: STMicroelectronics S.r.l.

    Inventor： Griseta, Antonio ,  Mazzone, Angelo ,  Penza, Luigi

    IPC: G11C29/00

    CPC classification number: G11C29/10 ,  G11C11/41

    Abstract: A method for testing a memory device (100) comprising an arrangement of a plurality of memory elements (104) is proposed. The method comprises a step for defining a first and a second scanning sequences for scanning the memory elements and a step for defining at least one test datum ({XX}). The method further includes the performance of at least once a succession of operations including:
    a) writing the test datum into the plurality of memory elements, accessing thereto according to the first scanning sequence;
    b) accessing each memory element according to the first scanning sequence, reading a content thereof and comparing the read content to the test datum, and writing thereinto a complement of said test datum;
    c) accessing each memory element according to the second scanning sequence, reading a content thereof and comparing the read content to the complement of the test datum, and writing thereinto said test datum;
    d) accessing each memory element according to the second scanning sequence, reading a content thereof and comparing the read content to the test datum, writing thereinto said complement of the test datum, and reading again the content thereof and comparing the read content to the complement of the test datum.

    Abstract translation: 提出了一种用于测试包括多个存储元件（104）的布置的存储器件（100）的方法。 该方法包括用于定义用于扫描存储器元件的第一和第二扫描序列的步骤以及用于定义至少一个测试数据（{XX}）的步骤。 该方法还包括至少执行一次连续的操作，包括：a）将测试数据写入到多个存储器元件中，根据第一扫描顺序访问它; b）根据第一扫描顺序访问每个存储元件，读取其内容并将读取的内容与测试数据进行比较，并将其写入所述测试数据的补码; c）根据第二扫描顺序访问每个存储器元件，读取其内容并将读取的内容与测试数据的补码进行比较，并将其写入所述测试数据; d）根据第二扫描顺序访问每个存储器元件，读取其内容并将读取的内容与测试数据进行比较，在其中写入测试数据的所述补码，并再次读取其内容，并将读取的内容与补码进行比较 的测试基准。

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