THICK FIELD DEVICE AND INTEGRATED CIRCUIT MOUNTED THEREWITH

    公开(公告)号:JPH08181283A

    公开(公告)日:1996-07-12

    申请号:JP14428495

    申请日:1995-06-12

    Abstract: PURPOSE: To obtain an integrated circuit device incorporating a thick field device improved as a protective mechanism against electrostatic discharge(ESD). CONSTITUTION: A thick field device comprises two PN junctions (P region 25 and N+ regions 21, 23) isolated by field oxide 27 and functions as a lateral bipolar transistor having a floating base. A dopant is then implanted, at a controlled concentration, under the field oxide 27 in order to lower the trigger voltage. A well extends beneath metal contacts 31, 33 to minimize the effect of junction spiking. The metal contacts 31, 33 extending while covering the field oxide 27 provide a barrier to migration of ion, otherwise reduce the leak current.

    INTEGRATED CIRCUIT INCLUDING OVERVOLTAGE PROTECTION MECHANISM AND PROTECTING METHOD THEREFOR

    公开(公告)号:JPH0855965A

    公开(公告)日:1996-02-27

    申请号:JP14428395

    申请日:1995-06-12

    Abstract: PURPOSE: To provide an ESD protection system operable for a mixed voltage circuit. CONSTITUTION: An ESD protection system is provided for supplying an ESD conduction paths between different power lines while effectively utilizing several different types of over-voltage protection devices. For example, shunt diodes 28 and 30 can be used between the ground lines of the different power supplies and between I/O pads and power supply lines, an SCR protecting mechanism 32 can be used between I/O pads and ground, and thick type field device protecting mechanisms 80, 82, 84, 86 and 88 can be used between different power supply VDD lines.

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