公开(公告)号：US20210376869A1

公开(公告)日：2021-12-02

申请号：US16766105

申请日：2018-11-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jiyong KIM ,  Hyoseok NA ,  Yeonjeong KIM ,  Youngju KIM ,  Jungjoon KIM ,  Jihoon KIM ,  Jongin LEE

IPC: H04B1/04 ,  H03F3/24 ,  H03G3/30

Abstract: An electronic device according to various embodiments of the present invention comprises: a housing; a plurality of antennas arranged on or inside the housing; a second communication circuit located inside the housing and electrically connected to the plurality of antennas; a first communication circuit, which is electrically connected to the second communication circuit, and generates a radio frequency (RF) signal or an intermediate frequency (IF) signal so as to transmit the RF or IF signal to the second communication circuit; a memory for storing at least one parameter set to correspond to the characteristic of the second communication circuit; and a control circuit electrically connected to the first communication circuit, wherein the control circuit can be set to transmit a control signal for controlling at least one amplifier included in the second communication circuit to the second communication circuit on the basis of the at least one parameter stored in the memory. Various embodiments of the present invention can be other embodiments.

公开(公告)号：US20210067255A1

公开(公告)日：2021-03-04

申请号：US16964854

申请日：2019-01-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jiyong KIM ,  Yeonjeong KIM ,  Jihoon KIM ,  Namkyoung KIM ,  Hyoseok NA ,  Junghwan SON ,  Tongho CHUNG

IPC: H04B17/12 ,  H04B17/15 ,  H04L27/20

Abstract: Various embodiments of the present invention relate to a method for inspecting whether an electronic device and a communication device included in the electronic device operate normally. A method for checking characteristics of a wireless communication device, according to various embodiments of the present invention, comprises the steps of: providing a wireless communication device at a first location, wherein the wireless communication device includes an antenna array and a wireless communication circuit electrically connected to the antenna array, and the wireless communication circuit is configured to transmit and receive signals having frequencies of 20 Ghz to 100 Ghz and includes a plurality of phase shifters configured to adjust phases of the signals in order to form directional beams together; providing a signal detecting device at a second location separated from the first location so as to detect a wireless signal from the wireless communication device; allowing the wireless communication device to transmit a first signal in a state in which all the phase shifters are configured to have a first delay; detecting a first power of the first signal by using the signal detecting device; allowing the wireless communication device to transmit a second signal in a state in which all the phase shifters are configured to have a second delay; and detecting a second power of the second signal by using the signal detecting device.

公开(公告)号：US20240319259A1

公开(公告)日：2024-09-26

申请号：US18608292

申请日：2024-03-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minseok KIM ,  Taesin KWAG ,  Yeonjeong KIM ,  Hyungkeun YOO ,  Jongchul KIM ,  Kyunghoon LEE

IPC: G01R31/28 ,  G06F30/367 ,  G06T7/00

CPC classification number: G01R31/2831 ,  G06F30/367 ,  G06T7/0004 ,  G06T2207/30148

Abstract: Provided is an electrical reliability properties prediction method including generating a plurality of pieces of optical spectrum data of a substrate, performing a wafer level reliability (WLR) process on the substrate, measuring electrical reliability property data based on the WLR process, matching an inspection region to the plurality of pieces of optical spectrum data and the electrical reliability property data, generating a data set, performing data pre-processing, training an electrical reliability properties prediction model, acquiring a plurality of pieces of target optical data from a database, and extracting, with respect to the plurality of pieces of target optical data, a feature vector from the plurality of pieces of target optical data, and detecting predicted electrical reliability property data of the plurality of pieces of target optical data based on the feature vector.

公开(公告)号：US20200381830A1

公开(公告)日：2020-12-03

申请号：US16939503

申请日：2020-07-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jihoon KIM ,  Jiyong KIM ,  Jongin LEE ,  Yeonjeong KIM ,  Hyoseok NA

IPC: H01Q7/00 ,  H01Q1/42 ,  H01Q1/48 ,  H01Q1/24 ,  H04B1/40

Abstract: According to various embodiments, an electronic device comprises: a first plate; a second plate facing the opposite direction of the first plate; a housing including a lateral member for encompassing the space between the first plate and the second plate; and an antenna structure, wherein the antenna structure includes: a plurality of insulating layers arranged in a stacked manner so as to be parallel to the first plate; a loop antenna array formed by the insulating layers and/or by the peripheries of the insulating layers; and a wireless communication circuit electrically connected to loop antennas, and configured to transmit and receive a first signal having a first frequency of a range of 3 GHz to 100 GHz.