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公开(公告)号:US12013374B2
公开(公告)日:2024-06-18
申请号:US17380414
申请日:2021-07-20
Applicant: Seagate Technology LLC
Inventor: Anand Venkatesh Sethuraman , Xinwei Li , Emil John C. Esmenda , Qui Tan , Ray Lilly , Koji Adachi , Connor James Freeman
CPC classification number: G01N3/02 , G01N3/30 , G01N33/386 , G01N2203/0062
Abstract: A method includes forming, by a laser beam supplied by a laser cutting system, a laser-cut line in each of a plurality of glass samples. Each different laser-cut line in each different glass sample of the plurality of glass samples is formed when the laser cutting system is at a different process setting. The method also includes subjecting each of the plurality of glass samples with the laser-cut lines to a break test, and obtaining a plurality of break strength values. Each different break strength value of the plurality of break strength values is indicative of a laser-cut line quality of the respective glass sample of the plurality of glass samples.
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公开(公告)号:US20230021846A1
公开(公告)日:2023-01-26
申请号:US17380414
申请日:2021-07-20
Applicant: Seagate Technology LLC
Inventor: Anand Venkatesh Sethuraman , Xinwei Li , Emil John C. Esmenda , Qui Tan , Ray Lilly , Koji Adachi , Connor James Freeman
Abstract: A method includes forming, by a laser beam supplied by a laser cutting system, a laser-cut line in each of a plurality of glass samples. Each different laser-cut line in each different glass sample of the plurality of glass samples is formed when the laser cutting system is at a different process setting. The method also includes subjecting each of the plurality of glass samples with the laser-cut lines to a break test, and obtaining a plurality of break strength values. Each different break strength value of the plurality of break strength values is indicative of a laser-cut line quality of the respective glass sample of the plurality of glass samples.
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公开(公告)号:US10896693B1
公开(公告)日:2021-01-19
申请号:US15454587
申请日:2017-03-09
Applicant: Seagate Technology LLC
Inventor: Lihong Zhang , Xiong Liu , Hongbo Wang , Xinwei Li
IPC: G11B5/73
Abstract: A stack comprises a substrate, a magnetic recording layer, and a negative thermal expansion layer disposed between the substrate and the magnetic recording layer. The negative thermal expansion layer is configured to reduce thermal profile changes of a surface of the stack opposite the substrate during a heat assisted magnetic recording write operation.
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