公开(公告)号：WO2023287343A1

公开(公告)日：2023-01-19

申请号：PCT/SE2022/050705

申请日：2022-07-08

Applicant: SPEC-IMAGING AB

Inventor： BERROCAL, Edouard

IPC: G02B5/18 ,  G01J3/18 ,  G01N21/49

Abstract: The disclosure relates to a grating (1) for optical measurements comprising: a base plate (2) extending in a plane in two spatial directions (102,103); a plural number q of periodic patterns (11,14,43,44,45,46), each with a surface (18) and space (19) periodic wave optical mask and each with a different interval frequency; wherein the periodic patterns (11,14,43,44,45,46) are arranged adjacent each other in the base plate (2). The disclosure further relates to a grating (1), an assembly for measurements of one or more optical parameters of a medium and a method of using the assembly.

公开(公告)号：EP4370954A1

公开(公告)日：2024-05-22

申请号：EP22842562.5

申请日：2022-07-08

Applicant: Spec-Imaging AB

Inventor： BERROCAL, Edouard

IPC: G02B5/18 ,  G01J3/18 ,  G01N21/49

CPC classification number: G01N21/49 ,  G01N21/31 ,  G01N21/64 ,  G01J3/1804 ,  G01J2003/184720130101 ,  G01J2003/281320130101 ,  G02B5/1861

公开(公告)号：EP3935357A1

公开(公告)日：2022-01-12

申请号：EP20765897.2

申请日：2020-03-02

Applicant: Spec-Imaging AB

Inventor： BERROCAL, Edouard ,  CHAZE, William ,  KRISTENSSON, Elias ,  ZOUEU, Jérémie

IPC: G01J3/00 ,  G01N21/17 ,  G01N21/31