A METHOD AND APPARATUS FOR ANALYSING A MATERIAL
    1.
    发明申请
    A METHOD AND APPARATUS FOR ANALYSING A MATERIAL 审中-公开
    一种分析材料的方法和设备

    公开(公告)号:WO2010025528A1

    公开(公告)日:2010-03-11

    申请号:PCT/AU2009001179

    申请日:2009-09-08

    CPC classification number: G01N23/087 G01N33/22

    Abstract: A method of analysing particles of a material which include a constituent is disclosed. The method comprises the steps of exposing particles of the material to x radiation having a range of x-radiation energies, detecting x-radiation intensities at two different energy levels transmitted through the particles, and determining the concentration of the constituent in particles from the detected intensities.

    Abstract translation: 公开了一种分析包含成分的材料的颗粒的方法。 该方法包括以下步骤:将材料的颗粒暴露于具有x辐射能量范围的x辐射,检测透过颗粒的两个不同能级的x辐射强度,以及从检测到的颗粒中确定颗粒中成分的浓度 强度。

    A METHOD AND APPARATUS FOR ANALYSING A MATERIAL
    2.
    发明公开
    A METHOD AND APPARATUS FOR ANALYSING A MATERIAL 有权
    VERFAHREN UND VORRICHTUNG ZUR ANALYZE EINES MATERIALS

    公开(公告)号:EP2335057A4

    公开(公告)日:2011-09-28

    申请号:EP09810939

    申请日:2009-09-08

    CPC classification number: G01N23/087 G01N33/22

    Abstract: A method of analyzing particles of a material which include a constituent is disclosed. The method comprises the steps of exposing particles of the material to x radiation having a range of x-radiation energies, detecting x-radiation intensities at two different energy levels transmitted through the particles, and determining the concentration of the constituent in particles from the detected intensities.

    Abstract translation: 公开了分析包含成分的材料的粒子的方法。 该方法包括以下步骤:将材料的颗粒暴露于具有x辐射能量范围的x辐射,检测通过颗粒传输的两个不同能级的x辐射强度,以及从检测到的颗粒中确定成分的浓度 强度。

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