公开(公告)号：WO1996004607A1

公开(公告)日：1996-02-15

申请号：PCT/US1994008780

申请日：1994-08-02

Applicant: TELAIRE SYSTEMS, INC.

Inventor： TELAIRE SYSTEMS, INC. ,  WONG, Jacob, Yauman

IPC: G06F17/50

CPC classification number: G01N21/274 ,  G01N21/3504 ,  G01N21/61 ,  G01N2201/12753 ,  G01N2201/12784

Abstract: Some cyclic variables include within each cycle a value that can be determined extrinsically. In such case, the sensed value may differ from the known value by an amount that is a combination of long-term drift of the sensor and random measuring error. The drift component can be evaluated and eliminated by the following method. Once each cycle, for a number of cycles, the sensor measures the variable at a time when its value should equal the extrinsically-known value. The differences are plotted versus time, and a best-fitting straight line is determined (38), which indicates the drift. Throughout the next cycle as the variable is continuously sensed, the drift determined (40) from the best-fitting straight line is continuously applied (42) to correct the sensed value.

Abstract translation: 一些循环变量包括在每个周期内可以通过外部确定的值。 在这种情况下，感测值可以与已知值不同，该量是传感器的长期漂移与随机测量误差的组合。 可以通过以下方法评估和消除漂移部件。 每个循环一次，在多个循环中，传感器在其值应等于外部已知值的时候测量变量。 差异相对于时间作图，并且确定最佳拟合直线（38），其指示漂移。 在连续感测变量的整个下一周期中，从最佳拟合直线确定的漂移（40）被连续地施加（42）以校正感测值。

公开(公告)号：WO1996000374A1

公开(公告)日：1996-01-04

申请号：PCT/US1994007195

申请日：1994-06-27

Applicant: TELAIRE SYSTEMS, INC.

Inventor： TELAIRE SYSTEMS, INC. ,  WONG, Jacob, Yauman

IPC: G01D18/00

CPC classification number: G01N21/3504

Abstract: The proper operation of an NDIR toxic gas sensor can be checked by using a non-toxic gas that has an absorption band that overlaps the absorption band used for measuring the toxic gas. The NDIR sensor cannot distinguish which of the two gases is responsible for causing the observed absorption of radiation in the sensor. Since detectors of toxic gases typically operate at low concentration levels, the extent of overlap between the absorption band of the toxic gas and of the non-toxic gas may be relatively small, since a larger concentration of the non-toxic gas can be used with no ill effects. The method may be applied to sensors for detecting carbon monoxide or methane for example.

Abstract translation: 可以通过使用具有与用于测量有毒气体的吸收带重叠的吸收带的无毒气体来检查NDIR有毒气体传感器的适当操作。 NDIR传感器不能区分两种气体中的哪一种导致传感器中观察到的辐射吸收。 由于有毒气体的检测器通常以低浓度水平运行，有毒气体和无毒气体的吸收带之间的重叠程度可能相对较小，因为可以使用较大浓度的无毒气体， 没有不良影响。 该方法可以应用于例如用于检测一氧化碳或甲烷的传感器。

公开(公告)号：WO1994017389A1

公开(公告)日：1994-08-04

申请号：PCT/US1994000700

申请日：1994-01-18

Applicant: TELAIRE SYSTEMS, INC.

Inventor： TELAIRE SYSTEMS, INC. ,  WONG, Jacob, Y.

IPC: G01N21/01

CPC classification number: G01N21/05 ,  G01N21/3504 ,  G01N21/39

Abstract: A gas sample chamber that is particularly advantageous for use with a semiconductor laser has the form of an elongated hollow tube (44) with a specularly reflective inside surface (50), a semiconductor laser (12) located at one end of the tube and a detector (34) located at the opposite end of the tube. In one embodiment, apertures (52, 54) in the wall of the tube permit a gas to enter and leave the sample chamber by free diffusion. In another embodiment the gas flows into the hollow tube (44) from a pressurized source through a port (64) or is drawn through the tube by a suction pump. In other embodiments, the tube is partitioned into two successive sections by means of a window (70) located within the tube. The window is transparent to radiation of two different wavelengths that coincide with the absorption bands of two different gases. The semiconductor laser is tuned to these wavelengths successively so that two gas components can be detected and measured simultaneously.

Abstract translation: 特别有利于与半导体激光器一起使用的气体样品室具有细长的中空管（44）的形式，其具有镜面反射内表面（50），位于管的一端的半导体激光器（12）和 检测器（34）位于管的相对端。 在一个实施例中，管的壁中的孔（52,54）允许气体通过自由扩散进入和离开样品室。 在另一个实施例中，气体从加压源通过端口（64）流入中空管（44），或者通过抽吸泵抽吸通过管。 在其他实施例中，通过位于管内的窗口（70）将管分成两个连续的部分。 窗口对于与两种不同气体的吸收带重合的两种不同波长的辐射是透明的。 半导体激光器被连续地调谐到这些波长，使得可以同时检测和测量两个气体成分。

公开(公告)号：WO1996001418A1

公开(公告)日：1996-01-18

申请号：PCT/US1994007530

申请日：1994-07-05

Applicant: TELAIRE SYSTEMS, INC.

Inventor： TELAIRE SYSTEMS, INC. ,  WONG, Jacob, Yauman

IPC: G01N21/61

CPC classification number: G01N21/0303 ,  G01N21/3504 ,  G01N21/61

Abstract: An instrument for determining the concentration of a particular gas that might be present in a sample has no moving parts and is extremely compact and inexpensive. A novel waveguiding structure (12) serves both as an optical element and as the sample chamber. As an optical element, the waveguiding structure collects radiation from a blackbody source (26) located at the entrance end (14) of the waveguiding structure and conducts the radiation through the waveguiding structure, concentrating it on two infrared detectors (40 and 42) mounted at the opposite end (16) of the waveguiding structure. As a sample chamber, the waveguiding structure causes the radiation to undergo multiple reflections that result in the average path length being substantially greater than the physical length of the waveguiding structure. Each of the detectors has its own optical filter, and a baffle (44) assures that each detector responds only to radiation which has passed through its filter. One filter (36) defines a spectral passband that coincides with the infrared absorption band of the gas to be measured. The other filter (38) defines a non-absorbing or neutral passband. The electrical signals produced by the detectors are processed to provide a ratio, the value of which is related to the concentration of the particular gas to be detected.

Abstract translation: 用于确定样品中可能存在的特定气体的浓度的仪器没有移动部件，并且非常紧凑和便宜。 新颖的波导结构（12）既用作光学元件又用作样品室。 作为光学元件，波导结构从位于波导结构的入口端（14）处的黑体源（26）收集辐射，并将辐射传导通过波导结构，将其集中在安装有两个红外检测器（40和42） 在波导结构的相对端（16）处。 作为样品室，波导结构导致辐射经历多次反射，导致平均路径长度远大于波导结构的物理长度。 每个检测器具有其自己的滤光器，并且挡板（44）确保每个检测器仅响应已经通过其过滤器的辐射。 一个滤光器（36）限定了与要测量的气体的红外吸收带重合的光谱通带。 另一个过滤器（38）限定非吸收或中性通带。 由检测器产生的电信号被处理以提供一个比率，其值与待检测的特定气体的浓度有关。

公开(公告)号：WO1995022045A1

公开(公告)日：1995-08-17

申请号：PCT/US1995001229

申请日：1995-01-30

Applicant: TELAIRE SYSTEMS, INC.

Inventor： TELAIRE SYSTEMS, INC. ,  WONG, Jacob, Y.

IPC: G01N21/35

CPC classification number: G01N21/61 ,  G01N21/0303 ,  G01N21/3504

Abstract: A miniaturized NDIR gas sensor is manufactured using semiconductor micromachining techniques from a semiconductor material such as SI or GaAS. The NDIR gas sensor (28) includes an optical waveguide (30), a light source (32) at one end of the waveguide, at least one light detector (36) at the end of the waveguide opposite the light source, a diffusion type gas sample chamber (34) formed within the waveguide and interposed in the optical path between the light source and light detector so that the light source and light detector are thermally isolated from the gas sample by windows (38, 39), and a separate bandpass filter (52) interposed between the light source and each light detector. Because the NDIR sensor is fabricated out of a semiconductor material, the source driver (76) and signal processing electronics (78) may be added directly to the sensor using integrated circuit fabrication techniques. Particles and smoke and dust may be kept out of the sample chamber by application of a gas permeable membrane (56) over apertures (54) in the sample chamber walls.

Abstract translation: 使用半导体材料如SI或GaAS的半导体微加工技术制造小型化的NDIR气体传感器。 NDIR气体传感器（28）包括光波导（30），在波导的一端的光源（32），在波导的与光源相对的端部处的至少一个光检测器（36），扩散型 气体样品室（34），其形成在波导内并插入在光源和光检测器之间的光路中，使得光源和光检测器通过窗口（38,39）与气体样品热隔离，并且单独的带通 介于光源和每个光检测器之间的过滤器（52）。 由于NDIR传感器由半导体材料制成，所以可以使用集成电路制造技术将源极驱动器（76）和信号处理电子器件（78）直接添加到传感器。 通过在样品室壁中的孔（54）上施加透气膜（56），颗粒和烟尘可以保持在样品室外。