公开(公告)号：WO2016115573A1

公开(公告)日：2016-07-21

申请号：PCT/US2016/013972

申请日：2016-01-19

Applicant: THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK

Inventor： MARKELZ, Andrea, G. ,  ACBAS, Gheorghe ,  NIESSEN, Katherine, A.

IPC: G01N21/35 ,  G02B21/00

CPC classification number: G01N21/3581 ,  G01N21/03 ,  G01N21/23 ,  G01N21/3586 ,  G01N2201/06113 ,  G01N2201/0683 ,  G02B21/0004

Abstract: An apparatus and method for Crystal Anisotropy Terahertz Microscopy ("CATM") is provided. The apparatus includes an emitter configured to emit a THz pulse and a detector configured to detect the THz pulse after the pulse is transmitted through a sample disposed on a sample surface of the detector. A pulsed radiation generator generates a probe beam to interrogate the detector. The detector may include an electro-optical ("EO") crystal configured to change in birefringence according to the THz pulse. The sample surface of the detector may have a dielectric coating which is transmissive to THz and reflective to the probe beam. The sample is disposed on the dielectric coating.

Abstract translation: 提供了一种晶体各向异性显微镜（“CATM”）的装置和方法。 该装置包括配置成发射THz脉冲的发射器和被配置为在脉冲通过设置在检测器的样本表面上的样本的脉冲之后检测THz脉冲的检测器。 脉冲辐射发生器产生探测光束以询问检测器。 检测器可以包括配置为根据THz脉冲改变双折射的电光（“EO”）晶体。 检测器的样品表面可以具有对THz透射并对探针光束反射的介电涂层。 将样品置于电介质涂层上。