公开(公告)号：JPH08122372A

公开(公告)日：1996-05-17

申请号：JP25656394

申请日：1994-10-21

Applicant: TOA ELECTRONICS

Inventor： USHIKUBO KIKUO

IPC: G01R27/02

Abstract: PURPOSE: To provide an insulation tester which can display measuring data in a histogram. CONSTITUTION: A discrimination device 12 is provided in a measuring part 11 of a main body of an insulation tester which measures the insulation resistance of an object. An insulation resistance value measured by the measuring part 11 is inputted to the device 12, whereby whether the object has good insulation properties or not is judged. At the same time, the device 12 classifies insulation resistance values of good objects every predetermined range in accordance with the size of the values. The insulation tester 10 is further provided with a counter 13 which sums a count of insulation resistance values within each range classified by the device 12 individually, a display device 14 having a histogram display function, and a setting means 15 for preliminarily setting a threshold value (size) for the insulation resistance value to judge good objects by the device 12. After the measurement, counts of the insulation resistance values in every predetermined range from the counter 13 are inputted to the display device 14 as statistic data and displayed in a histogram.

公开(公告)号：JPH08146057A

公开(公告)日：1996-06-07

申请号：JP28483694

申请日：1994-11-18

Applicant: TOA ELECTRONICS

Inventor： USHIKUBO KIKUO

IPC: G01R27/02

Abstract: PURPOSE: To provide a method for speeding up the measurement of insulation resistance even if an arithmetic means method is used to perform measurements a plurality of times, and conducting arithmetic mean of the results before outputting and for accurately and stably measuring even an ultra-high resistance. CONSTITUTION: In the measurement of insulation resistance using an arithmetic mean method, a measurement times N for arithmetic mean is minimized when the charging current at the initial stage of measurement is large, and also current change is large and the measurement times N for arithmetic mean is increased when the charge current decreases and exceeds a reference value where a measurement current value can be set, thus averaging noise components, and hence reducing a measurement time until the measurement current value reaches a reference value from the initial stage of measurement and speeding up measurement. Also, noise components can be averaged after the measurement current value exceeds the reference value and the measurement value becomes stable, thus achieving an accurate measurement regardless of an ultra-high insulation resistance where the measurement value becomes stable.