-
1.
公开(公告)号:EP4023142A1
公开(公告)日:2022-07-06
申请号:EP20858277.5
申请日:2020-06-01
Applicant: TOPCON CORPORATION
Inventor: SHIMIZU, Hitoshi , OMORI, Kazuhiro , TSUKADA, Hisashi
IPC: A61B3/135
Abstract: A slit-lamp microscope according to an exemplary embodiment comprises a scanning unit, a control unit, and an image set creating unit. The scanning unit scans, with slit light, an anterior eye part of an eye to be inspected, and collects an image group. The control unit controls the scanning unit to apply two or more scans to the anterior eye part. The image set creation unit creates an image set by selecting, from two or more image groups collected by the scanning unit in response to the two or more scans, a series of images corresponding to a scanning range.