Abstract:
PROBLEM TO BE SOLVED: To provide a display device having a high reliability.SOLUTION: In a method of manufacturing a display device according to an embodiment, a second substrate part having a second substrate and an anode provided on the second substrate is caused to face a first substrate part having a first substrate, an n-channel type thin-film transistor provided on the first substrate, and a cathode connected to the thin-film transistor via an intermediate layer. The second substrate part is joined to the first substrate part while the intermediate layer is interposed between the anode and the cathode.
Abstract:
PROBLEM TO BE SOLVED: To provide a display device using an oxide semiconductor whose characteristic variation due to a heat treatment is suppressed.SOLUTION: There are provided a thin-film transistor comprising: an insulating layer; a gate electrode on the insulating layer; a semiconductor layer which is disposed on the gate electrode through a gate insulating layer and is formed by an oxide layer; and a source electrode and a drain electrode which are disposed on the semiconductor layer apart from each other across the gate electrode, and a display device comprising: a pixel electrode having an electric resistance lower than that of the semiconductor layer which are connected to any one of the source electrode and the drain electrode and are formed by the oxide layer; an optical element which causes at least either a change in optical characteristics or light emission by an electric signal supplied to the pixel electrode; and a film disposed below the pixel electrode and is formed by the same material as the gate insulating layer, wherein the surface on the side of the semiconductor layer of the gate insulating film on the gate electrode has higher smoothness than the surface on the side of the pixel electrode of a film disposed below the pixel electrode.
Abstract:
PROBLEM TO BE SOLVED: To maintain excellent display performance for a long period of time by improving accuracy of compensating a threshold voltage shift of a driving transistor controlling a current supplied to a current drive type self-light emitting element. SOLUTION: A display device includes: a driving transistor Dr having a drain connected to a light emitting element 11 and a source connected to a power supply line NL; a capacitor Ck having one end connected to a gate of the driving transistor Dr; a threshold voltage detecting transistor Det connected between the drain of the driving transistor Dr and the other end of the capacitor Ck; and a reset transistor Rst connected between the source and gate of the driving transistor Dr. The gate of the driving transistor Dr is charged up to a predetermined value through the reset transistor Rst, and electric charge at the other end of the capacitor Ck is discharged through the threshold voltage detecting transistor Det, so that the potential difference across the capacitor Ck is held at the threshold voltage of the driving transistor Dr. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To improve a dielectric breakdown lifetime and a magnetic resistance ratio of a tunnel barrier. SOLUTION: A magnetoresistance effect element comprises: a first ferromagnetic layer 102 formed above a substrate; a second ferromagnetic layer 104 formed above the first ferromagnetic layer 102; an insulating layer 207 formed between the first ferromagnetic layer and the second ferromagnetic layer and formed of a metal oxide; and a nonmagnetic metal layer 208 formed between the insulating layer and the second ferromagnetic layer coming into contact with a face on the second ferromagnetic layer side of the insulating layer, and containing the same metal element with the metal element constituting the metal oxide. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To enable further reducing an inverse current in magnetization inversion. SOLUTION: This magnetoresistive element is provided with: a magnetization free layer 10 having a first face and a second face opposite to the first face and having variable magnetization direction; a magnetization fixing layer 6 provided on the first face side in the first and second faces of the magnetization free layer and having fixed magnetization direction; a first tunnel barrier layer 8 provided between the magnetization free layer and the magnetization fixing layer; a second tunnel barrier layer 12 provided on the second face of the magnetization free layer; and a non-magnetization layer 14 provided so as to contact the face opposite to the magnetization free layer of the second tunnel barrier layer. The magnetization direction of the magnetization free layer can be varied based on conduction between the magnetization free layer and the non-magnetization layer, and a resistance ratio between the first tunnel barrier layer and the second tunnel barrier layer is within a range of 1:0.25 to 1:4. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a magnetic memory which enables turning into a large capacity and high-speed writing. SOLUTION: The magnetic memory includes a memory cell which comprises a magnetic recording layer 4 whose direction of magnetization changes according to external magnetic field, a magnetization fitted layer 8 in which direction of magnetization is fixed, a storage element 2 comprising a nonmagnetic intermediate layer 6 provided between the magnetic recording layer and the magnetization fixed layer, a writing wiring 20 which is provided on the side opposite to the nonmagnetic intermediate layer of the magnetic recording layer and in which a writing current flows, and a yoke 25 provided to contact the surface of the writing wiring such as on a side opposite to the magnetic record layer. A pair of facing side surfaces of the storage element are set on the same plane with respective pair of facing side surfaces of the writing wiring and yoke, with a 5 or larger for the non-permeability of the magnetic recording layer. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a magnetic random access memory with a reduced write current and an enhanced write efficiency by making a write magnetic field strength applied to a center of a free layer of an MTJ element with a tunnel magneto-resistive effect equal to that applied to an end of the free layer so as to suppress the reduction in the write efficiency due to an inverted magnetic field. SOLUTION: In the magnetic random access memory wherein information is written by supplying a current to a write wire WWL closely located to the MTJ element to produce an induced magnetic flux thereby changing a magnetization direction of the free layer of the MTJ element comprising two magnetic layers sandwiching a nonmagnetic layer, wherein the resistance of the MTJ element changing depending on a state of the orientation of magnetization of the two magnetic layers of the MTJ element corresponds to a '0'/'1' level of storage information, the MTJ element is bent so as to be almost coincident with a curve indicated by a magnetic field produced from the write wire. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To allow a write magnetic field to efficiently work on a TMR element of an MRAM. SOLUTION: Immediately under the TMR element 23, a write word line 20B is disposed. The write word line 20B is extended in an X direction, and side faces and the bottom face of the write word line 20B are covered with a yoke material 25B having high magnetic permeability. The yoke material 25B sinks below the top face of the write word line 20B. Immediately above the TMR element 23, a data selection line (read/write bit line) 24 is disposed. The data selection line 24 is extended in a Y direction which crosses the X direction. The top face of the data selection line 24 is covered with a yoke material 27 having high magnetic permeability. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a magneto-resistance effect element in which, even when an area is reduced, a residual magnetization of a free ferromagnetic layer is sufficiently large, and which can be subjected to a flux reversal by a sufficiently weak magnetic field. SOLUTION: In the magneto-resistance effect element, a free ferromagnetic layer 4 contains, in shape, a quadrilateral-shaped first part 4a which comprises first opposite sides in parallel with each other and second opposite sides in parallel with each other, and a pair of second parts 4b which extends from a pair of diagonal parts of the first part 4a to a direction parallel to the second opposite side, and in which a maximum width in a direction parallel to the first opposite side is narrower than a length of the first opposite side. Further, the shape of free ferromagnetic layer 4 is asymmetrical in terms of a straight line passing a center of the first part 4a and parallel to the second opposite side. An easy-to-magnetize axis of the free ferromagnetic layer 4 is in parallel with a first direction 41 almost parallel to the second opposite side, a second direction 42 almost parallel to a longest line of lines coupling one contour of the second part 4b to the other contour thereof, or a direction on an acute angle side which exists between the first direction 41 and the second direction 42, and is made by these directions. COPYRIGHT: (C)2004,JPO