Abstract:
PROBLEM TO BE SOLVED: To achieve an exposure step of a magnetic storage element with excellent controllability.SOLUTION: A manufacturing method for magnetic memory includes the steps of: forming a magnetic storage element film 41 on a lower electrode 40; forming a mask layer 42 on the magnetic storage element film 41; processing the magnetic storage element film 41 using the mask layer 42; covering the processed magnetic storage element film 41 by a protection film 43; forming a high ionization rate film 44 on the protection film 43; depositing an interlayer insulating film 25 on the high ionization rate film 44; exposing the high ionization rate film 44 by thinning the interlayer insulating film 25; exposing the mask layer 42 by etching the high ionization rate film 44 and the protection film 43; and forming an upper electrode 45 on the mask layer 42.
Abstract:
PROBLEM TO BE SOLVED: To attain a large capacity while maintaining a high thermal disturbance resistance of bit information even in microfabrication. SOLUTION: The magneto-resistance effect device includes a non-magnetic layer 13 between a recording layer 11 having vertical magnetization and a fixed layer 12, a magnetic metal layer 18 between the non-magnetic layer 13 and the fixed layer 12, and a magnetic metal layer 19 between the non-magnetic layer 13 and the recording layer 11. The non-magnetic layer 13 includes MgO with the (001) plane oriented. The magnetic metal layers 18, 19 comprise a magnetic material with the (001) plane oriented, selected from the group consisting of Co, Fe, a Co-Fe alloy, and a Fe-Ni alloy. At least one of the recording layer 11 and the fixed layer 12 includes a layer including at least one selected from the group consisting of Fe, Co and Ni and a layer including at least one selected from the group consisting of Cr, Pt, Pd, Ir, Rh, Ru, Os, Re, Au and Cu laminated alternately. The dumping constant of the magnetic metal layer 19 is smaller than that of the recording layer 11. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce variations in inversion current density upon magnetic reversal. SOLUTION: A magnetoresistive element 10 includes an underlying layer 12 having a cubic or tetragonal crystal structure oriented in a (001) plane, a recording layer 13 provided on the underlying layer 12, having magnetic anisotropy perpendicular to a film surface, and having an fct (face-centered tetragonal) structure oriented in a (001) plane, a non-magnetic layer 14 provided on the recording layer 13, and a reference layer 15 provided on the non-magnetic layer 14, and having magnetic anisotropy perpendicular to the film surface. An in-plane lattice constant a1 of the underlying layer 12 and the in-plane lattice constant a2 of the recording layer 13 satisfy the following relation of |√2×a1/2-a2|/a2
Abstract:
PROBLEM TO BE SOLVED: To arrange an appropriate material in at least one layer of a pinned layer and a free layer to increase a resistance change in a vertical excitation magnetoresistive effect device of a spin-valve structure. SOLUTION: Provided is a giant magnetoresistive effect device characterized by: a magnetization pinned layer having the direction of magnetization pinned substantially to one direction; a magnetization free layer having the direction of magnetization changed depending on an external magnetic field; a nonmagnetic intermediate layer formed between the magnetization pinned layer and the magnetization free layer; and electrodes adapted for making a sense current conductive in the direction substantially perpendicular to surfaces of the films of the magnetization pinned layer, the nonmagnetic intermediate layer and the magnetization free layer in which the magnetized pinned layer has substantially such a structure that two or more layers formed of bimetallic alloys represented by a general formula (i) Fe a Co 100-a (where 25 atom%≤a≤75 atom%) and (ii) one or more layers formed of Cu each as thick as 0.1 nm to 1 nm are alternately stacked. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce further current density required for magnetization reversal. SOLUTION: A magnetoresistive element 10 includes a first free layer 15 in which a direction of magnetization changes by action of electrons with spin polarized; a second free layer 13 in which the direction of the magnetization changes by the action of the electrons with the spin polarized; a fixed layer 11 in which the direction of the magnetization is fixed; a first nonmagnetic layer 14 provided between the first free layer 15 and the second free layer 13; and a second nonmagnetic layer 12 provided between the second free layer 13 and the fixed layer 11. The relation between a product Ku1×V1 of a magnetic anisotropy constant Ku1 and activation volume V1 of the first free layer 15, and a product Ku2×V2 of a magnetic anisotropy constant Ku2 and activation volume V2 of the second free layer 13 satisfies Ku1×V1>Ku2×V2. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce a current which is necessary for write of data regarding a magnetic storage device. SOLUTION: The magnetic storage device comprises a magnetic record layer 19D whose magnetization direction is reversed according to the direction of an applied magnetic field and a magnetized deposition layer 19B whose magnetization direction is fixed. It also comprises a memory cell 19 which stores information by magnetoresistive effect and a wiring layer 11 which extends in a first direction, is narrower than the magnetic recording layer 19D in a second direction at right angles to the first direction, and writes the information in the memory cell 19. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a magneto-resistance effect head or the like the gap of which can be made narrower to deal with higher recording density. SOLUTION: The magneto-resistance effect head is provided with: a first, second, and third region which are arranged sequentially from the medium-facing surface side toward the rear part separate from a medium-facing surface; a magnetization free layer 1 which is formed on the first region and the magnetization of which can be rotated by an external magnetic field; a magnetization fixing layer 5 which is formed on the third region and can substantially hold the value of a given direction under the external magnetic field; an intermediate layer 3 which is formed on the second region and connects the magnetization free layer 1 to the magnetization fixing layer 5; and a pair of magnetic shields 17, 19 between which the magnetization free layer 1, the magnetization fixing layer 5, and the intermediate layer 3 are interposed and which are extended toward the rear part from the medium facing surface. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a magnetoresistance effect element of high density which has a low interlayer coupling magnetic field and a high breakdown voltage while appropriate element resistance and a high MR change rate are maintained, and which can correspond to future high magnetic recording density. SOLUTION: The magnetoresistance element is constituted of a magnetoresistance film and a pair of electrode films. The magnetoresistance effect film is provided with a magnetization fixing layer in which the direction of magnetization is substantially fixed to one direction; a magnetization free layer in which the direction of magnetization freely changes by an outer magnetic field; and a magnetoresistance effect film which is arranged between the magnetization fixing layer and the magnetization free layer, and which includes a non-magnetic intermediate layer having a laminated structure of a first non-metal intermediate layer, a metal intermediate layer and a second non-metal intermediate layer. The pair of electrode films are arranged in such a way that they are conducted in an almost vertical direction with respect to the film face of the magnetoresistance effect film, and are electrically connected to the magnetoresistance effect film. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a vertical conducting type magnetoresistance effect head capable of realizing a high output and a high S/N ratio by suppressing a sense current magnetic field to be applied to a magnetic sensitive region of a vertical conducting type magnetoresistance effect film. SOLUTION: The vertical conducting type magnetoresistance effect element comprises a magnetoresistance effect film (13) having a free layer, a pin layer and a spacer layer interposed therebetween, and a lower electrode (11) and an upper electrode (16) formed on and underneath the film (13) to conduct a current in a vertical direction to a surface of the film (13). The electrode (16) has an inside electrode (162) connected to the film (13) and an outside electrode (161) connected to the film (13) and formed on a periphery of the inside electrode (161). In this case, the electrode (162) has a lower electric resistivity than that of the electrode (161).
Abstract:
PROBLEM TO BE SOLVED: To prevent electrical short circuit due to re-deposition without causing degradation of the element characteristics.SOLUTION: The magnetoresistive effect element includes a storage layer 11 having a variable magnetization direction, a tunnel barrier layer 12 on the storage layer 11, a reference layer 13 having an invariable magnetization direction on the tunnel barrier layer 12, a hard mask layer 14 on the reference layer 13, and a sidewall spacer layer 17 on the sidewall of the reference layer 13 and hard mask layer 14. The storage layer 11 and reference layer 13 have vertical magnetization, and the plane size of the reference layer 13 is smaller than that of the storage layer 11. Difference in size between the storage layer 11 and reference layer 13 is 2 nm or less, and the sidewall spacer layer 17 includes one of diamond, DLC, BN, SiC, BC, AlOand AlN.