公开(公告)号：WO2008115241A1

公开(公告)日：2008-09-25

申请号：PCT/US2007/069168

申请日：2007-05-17

Applicant: TOUCHDOWN TECHNOLOGIES, INC.

Inventor： DENNIS, Cameron

IPC: G01R31/02

CPC classification number: G06Q10/087 ,  G01R1/07342

Abstract: A novel information system for optimizing a phase in the lifespan of a probe card for semiconductor wafer testing, by receiving, storing, and disseminating probe card data over a network between customer and supplier. The system optimizes the ordering of a probe card by a customer, the manufacture of the probe card by a supplier, and the performance and repair of the probe card during its lifespan. The information system includes a server that receives, stores, and disseminates historical information gathered during the order, manufacture, performance, and repair phases of probe cards. A server application receives current information from a probe card customer or supplier, calculates metrics based on this information, compares the metric to previously recorded historical data, and communicates the results of the comparison and the historical data to a system user.

Abstract translation: 一种新颖的信息系统，用于通过在客户和供应商之间的网络上接收，存储和传播探针卡数据来优化用于半导体晶片测试的探针卡的寿命阶段。 该系统优化了客户对探针卡的排序，供应商制造探针卡，以及探针卡寿命期间的性能和维修。 该信息系统包括一个服务器，用于接收，存储和传播在探针卡的订单，制造，执行和修复阶段收集的历史信息。 服务器应用程序从探测卡客户或供应商接收当前信息，基于该信息计算度量，将度量与先前记录的历史数据进行比较，并将比较结果和历史数据传送给系统用户。