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公开(公告)号：WO2007078493A1
公开(公告)日：2007-07-12
申请号：PCT/US2006/045870
申请日：2006-11-30
Applicant: TOUCHDOWN TECHNOLOGIES, INC.
Inventor： GARABEDIAN, Raffi , TEA, Nim, Hak , WANG, Steven , KARKLIN, Heather
CPC classification number: G01R3/00 , G01R1/07378 , Y10T29/53243
Abstract: A probe card assembly (300) has a probe contactor substrate (310) having a plurality of probe contactor tips (395) thereon and a probe card wiring board (330) with an interposer (340) disposed between the two. Support posts (320) contacting the probe contactor substrate are vertically adjustable until secured by a locking mechanism (380) which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contactor substrates is substantially parallel to a predetermined reference plane.
Abstract translation: 探针卡组件（300）具有在其上具有多个探针接触器尖端（395）的探针接触器基板（310）和设置在两者之间的插入件（340）的探针卡布线板（330）。 与探针接触器基板接触的支撑柱（320）可垂直调节，直到通过联接到探针卡布线板的锁定机构（380）固定。 当柱固定在固定位置时，位置是多个探针接触器基板的平面基本上平行于预定参考平面的位置。
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公开(公告)号：WO2007092174A1
公开(公告)日：2007-08-16
申请号：PCT/US2007/002131
申请日：2007-01-26
Applicant: TOUCHDOWN TECHNOLOGIES, INC.
Inventor： ISMAIL, Salleh , GARABEDIAN, Raffi , WANG, Steven
CPC classification number: G01R1/07307 , G01R31/2889
Abstract: A probe head for testing semiconductor wafers has a probe contactor substrate have a first side and a second side. A plurality of probe contactor tips are coupled to the first side and the plurality of tips lie in a first plane. A plurality of mounting structures are coupled to the second side with each of the mounting structures each having a top surface lying in a second plane, wherein the first plane is substantially parallel to the second plane.
Abstract translation: 用于测试半导体晶片的探针头具有第一侧和第二侧的探针接触器衬底。 多个探针接触器尖端联接到第一侧并且多个尖端位于第一平面中。 多个安装结构联接到第二侧，每个安装结构各自具有位于第二平面中的顶表面，其中第一平面基本上平行于第二平面。
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公开(公告)号：EP1963869A1
公开(公告)日：2008-09-03
申请号：EP06844676.4
申请日：2006-11-30
Applicant: Touchdown Technologies, Inc.
Inventor： GARABEDIAN, Raffi , TEA, Nim, Hak , WANG, Steven , KARKLIN, Heather
CPC classification number: G01R3/00 , G01R1/07378 , Y10T29/53243
Abstract: A probe card assembly (300) has a probe contactor substrate (310) having a plurality of probe contactor tips (395) thereon and a probe card wiring board (330) with an interposer (340) disposed between the two. Support posts (320) contacting the probe contactor substrate are vertically adjustable until secured by a locking mechanism (380) which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contactor substrates is substantially parallel to a predetermined reference plane.
Abstract translation: 探针卡组件（300）具有其上具有多个探针接触器尖端（395）的探针接触器基底（310）和具有设置在两者之间的中介层（340）的探针卡接线板（330）。 与探针接触器衬底接触的支柱（320）是垂直可调的，直到被耦合到探针卡接线板的锁定机构（380）固定为止。 当柱固定在固定位置时，该位置是多个探针接触器衬底的平面基本平行于预定参考平面的位置。
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4.发明公开PROBE HEAD WITH MACHINED MOUNTING PADS AND METHOD OF FORMING SAME 审中-公开根据上述制造所编辑的ANBRINGKONTAKTSTELLEN机器和过程PROBE
公开(公告)号：EP1984748A1
公开(公告)日：2008-10-29
申请号：EP07717045.4
申请日：2007-01-26
Applicant: Touchdown Technologies, Inc.
Inventor： ISMAIL, Salleh , GARABEDIAN, Raffi , WANG, Steven
CPC classification number: G01R1/07307 , G01R31/2889
Abstract: A probe head for testing semiconductor wafers has a probe contactor substrate have a first side and a second side. A plurality of probe contactor tips are coupled to the first side and the plurality of tips lie in a first plane. A plurality of mounting structures are coupled to the second side with each of the mounting structures each having a top surface lying in a second plane, wherein the first plane is substantially parallel to the second plane.
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