公开(公告)号：JPS5516294A

公开(公告)日：1980-02-04

申请号：JP6601679

申请日：1979-05-28

Applicant: TEKTRONIX INC

Inventor： SUTEIIBUN SUUERINGU ,  SUTEIIBUN ROBAATO SUMISU ,  TOOMASU UIRIAMU WAIZUMAN

IPC: G01R31/28 ,  G01R31/3193 ,  G06F11/26 ,  G06F11/277 ,  G06F17/50

公开(公告)号：JPS6120816B2

公开(公告)日：1986-05-23

申请号：JP6601679

申请日：1979-05-28

Applicant: Tektronix Inc

Inventor： SUTEIIBUN SUERINGU ,  SUTEIIBUN ROBAATO SUMISU ,  TOOMASU UIRIAMU WAIZUMAN

IPC: G01R31/28 ,  G01R31/3193 ,  G06F11/26 ,  G06F11/277 ,  G06F17/50

CPC classification number: G06F11/261 ,  G01R31/31935 ,  G06F11/277 ,  G06F2201/83

Abstract: A digital diagnostic system employs signature analysis for locating faults at the system, module, or circuit component level in electronic equipment. Predetermined correct signatures and diagnostic decision tree information for a particular device under test are stored in system memory. The diagnostic system exercises the device under test to generate signatures which are obtained at various predetermined test points and electronically compared with a stored signature. From the diagnostic decision tree information, a troubleshooting sequence is automatically established which leads directly to a faulty module or component. In-circuit microprocessor emulation may be utilized to generate one or more of the signature signals.