公开(公告)号：US20230232723A1

公开(公告)日：2023-07-20

申请号：US14328120

申请日：2014-07-10

Applicant: The University of Houston System

Inventor： Jarek Wosik ,  Jerzy Krupka ,  Venkat Selvamanickam

IPC: G01R33/12 ,  G01R33/00 ,  H10N60/20

CPC classification number: G01R33/1246 ,  G01R33/007 ,  H10N60/203

Abstract: A method and apparatus for quality control of superconducting tapes, comprising non-destructive and non-contact methods for measuring the surface resistance of a superconducting tape during tape growth. The dielectric resonator techniques of the present invention can be adapted for measurements at the elevated temperatures used during annealing as well as at room and lower temperatures, providing the opportunity for real-time quality control of semiconductor tapes as they are being fabricated.