APPARATUS AND METHODS FOR ONE OR MORE WAVELENGTH SWEPT LASERS AND THE DETECTION OF SIGNALS THEREOF
    1.
    发明申请
    APPARATUS AND METHODS FOR ONE OR MORE WAVELENGTH SWEPT LASERS AND THE DETECTION OF SIGNALS THEREOF 审中-公开
    一种或多种波长扫描激光的装置和方法及其信号的检测

    公开(公告)号:WO2017048832A1

    公开(公告)日:2017-03-23

    申请号:PCT/US2016/051719

    申请日:2016-09-14

    Abstract: An optical instrument including at least a first and second wavelength swept vertical cavity laser (VCL) sources. The wavelength sweeping ranges spanned by the first and second VCL sources may differ with a region of spectral overlap. The first and second VCL sources may be operable under different modes of operation, wherein the modes of operation differ in at least one of: sweep repetition rate, sweep wavelength range, sweep center wavelength, and sweep trajectory. A VCL source may also exhibit sweep-to-sweep variation. Apparatus and methods are described for aligning sample signal data from the first VCL and sample signal data from the second VCL to generate output digital data. The output digital data is aligned with respect to at least one of: wavelength, wavenumber, and interferometric phase. The apparatus and methods can also be used to phase stabilize successive sweeps from the same VCL source or wavelength swept source.

    Abstract translation: 一种光学仪器,包括至少第一和第二波长扫描垂直腔体激光器(VCL)源。 由第一和第二VCL源跨越的波长扫描范围可以随着光谱重叠的区域而不同。 第一和第二VCL源可以在不同的操作模式下操作,其中操作模式在以下至少一个方面不同:扫描重复率,扫描波长范围,扫描中心波长和扫描轨迹。 VCL源也可能具有扫掠到扫描的变化。 描述了用于对准来自第一VCL的采样信号数据和来自第二VCL的采样信号数据以产生输出数字数据的装置和方法。 输出数字数据相对于波长,波数和干涉相位中的至少一个对准。 该装置和方法也可用于相位稳定来自相同VCL源或波长扫描源的连续扫描。

    METHOD FOR IMPROVING THE UTILIZATION OF MANUFACTURING MACHINES IN MANUFACTURING PROCESSES
    2.
    发明申请
    METHOD FOR IMPROVING THE UTILIZATION OF MANUFACTURING MACHINES IN MANUFACTURING PROCESSES 审中-公开
    提高制造过程中制造机器利用率的方法

    公开(公告)号:WO2015042474A1

    公开(公告)日:2015-03-26

    申请号:PCT/US2014/056668

    申请日:2014-09-19

    Applicant: THORLABS, INC.

    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for improving the utilization of manufacturing machines in manufacturing processes. In a typical implementation, manufacturing machine utilization is improved by publishing a schedule of Production Events, accepting customer orders within Production Events, and calculating prices for the customers modified based on the customer orders.

    Abstract translation: 包括编码在计算机存储介质上的计算机程序的方法,系统和装置用于改善制造过程中制造机器的利用率。 在典型的实施中,通过发布生产事件的时间表,在生产事件中接受客户订单,以及根据客户订单计算修改的客户的价格,来提高制造机器的利用率。

    MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTERFEROMETRY
    3.
    发明申请
    MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTERFEROMETRY 审中-公开
    具有通过低相干干涉进行自动调焦的微观系统

    公开(公告)号:WO2016122883A1

    公开(公告)日:2016-08-04

    申请号:PCT/US2016/013228

    申请日:2016-01-13

    Applicant: THORLABS, INC.

    Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

    Abstract translation: 公开了使用低相干干涉测量技术来创建用于光学显微镜的自动聚焦装置的几种技术方法。 这些方法允许自动聚焦在紧邻反射表面并在折射材料之后的薄结构,如覆盖滑动,以及将聚焦位置自动调节到样品区域中,而不受邻近表面反射的干扰。 补偿由覆盖样品的材料折射引起的测量偏移。 提出的是一种仪器的技术,允许在低相干干涉测量自动对焦系统中自动交换成像目标,这与TDI(时间延迟积分)成像,共聚焦和双光子荧光显微镜相结合是主要感兴趣的。

    OPTICAL SPECTROSCOPIC MEASUREMENT SYSTEM
    4.
    发明申请
    OPTICAL SPECTROSCOPIC MEASUREMENT SYSTEM 审中-公开
    光学光谱测量系统

    公开(公告)号:WO2016094642A1

    公开(公告)日:2016-06-16

    申请号:PCT/US2015/064965

    申请日:2015-12-10

    Applicant: THORLABS, INC.

    Abstract: A system capable of highly sensitive measurement of material concentration values in a sample using an optical spectroscopic method is disclosed. The system utilizes high-speed data acquisition and high resolution sampling of the raw signals output by the sensors with reduced total channel counts, and performs frequency analysis of the signals using the Fourier transform method to process all sensor channels in parallel. When each sensor is targeting the detection of some certain materials at some certain frequencies, the system is capable of simultaneous detection of multiple materials of interest in the sample with high measurement sensitivity and high speed.

    Abstract translation: 公开了一种能够使用光学分光法对样品中的材料浓度值进行高灵敏度测量的系统。 该系统利用传感器输出的原始信号进行高速数据采集和高分辨率采样,总信道数减少,并使用傅立叶变换方法对信号进行频率分析,并行处理所有传感器通道。 当每个传感器以某些特定频率对某些材料进行检测时,系统能够以高测量灵敏度和高速度同时检测样品中感兴趣的多种材料。

    TUNABLE MID-IR FIBER LASER FOR NON-LINEAR IMAGING APPLICATIONS
    5.
    发明申请
    TUNABLE MID-IR FIBER LASER FOR NON-LINEAR IMAGING APPLICATIONS 审中-公开
    用于非线性成像应用的TIRNABLE中红外光纤激光器

    公开(公告)号:WO2015105856A1

    公开(公告)日:2015-07-16

    申请号:PCT/US2015/010453

    申请日:2015-01-07

    Applicant: THORLABS, INC.

    Abstract: A microscopy system, including: a mode-locked fiber laser (110) configured to output a pulse having a center wavelength; a nonlinear waveguide (120) configured to shift the wavelength of the pulse from the mode-locked fiber laser; a fiber amplifier (130) configured to amplify the output from the first nonlinear waveguide; a second-harmonic generator (140) configured to generate femtosecond pulses at twice the optical frequency from the output of the fiber amplifier; and an imaging system (150).

    Abstract translation: 一种显微镜系统,包括:锁模光纤激光器(110),被配置为输出具有中心波长的脉冲; 被配置为从所述锁模光纤激光器偏移所述脉冲的波长的非线性波导(120) 配置为放大来自第一非线性波导的输出的光纤放大器(130); 二次谐波发生器(140),被配置为从所述光纤放大器的输出产生两倍光频率的飞秒脉冲; 和成像系统(150)。

    MID-INFRARED VERTICAL CAVITY LASER
    6.
    发明申请

    公开(公告)号:WO2019018411A1

    公开(公告)日:2019-01-24

    申请号:PCT/US2018/042512

    申请日:2018-07-17

    Abstract: Disclosed is an optically pumped vertical cavity laser structure operating in the mid-infrared region, which has demonstrated room-temperature continuous wave operation. This structure uses a periodic gain active region with type I quantum wells comprised of InGaAsSb, and barrier/cladding regions which provide strong hole confinement and substantial pump absorption. A preferred embodiment includes at least one wafer bonded GaAs-based mirror. Several preferred embodiments also include means for wavelength tuning of mid-IR VCLs as disclosed, including a MEMS-tuning element. This document also includes systems for optical spectroscopy using the VCL as disclosed, including systems for detection concentrations of industrial and environmentally important gases.

    MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLICATIONS
    7.
    发明申请
    MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLICATIONS 审中-公开
    微机电系统可调式VCSEL驱动的开源节流器,用于三维计量应用

    公开(公告)号:WO2017165793A1

    公开(公告)日:2017-09-28

    申请号:PCT/US2017/024062

    申请日:2017-03-24

    Applicant: THORLABS, INC.

    Abstract: Disclosed is an optical probe system that is capable of high speed, high precision, and high resolution 3D digitalization of engineered objects. The 3D dimensional data of the engineered object is measured using a swept source optical coherence tomography system with improved speed, spatial resolutions, and depth range. Also disclosed is a type of coordinate measurement machine (CMM) that is capable of performing high speed, high resolution, and non-contact measurement of engineered objects. The mechanic stylus in the touch-trigger probe of a conventional CMM is replaced with an optical stylus with reconfigurable diameter and length. The distance from the center of the optical stylus to the measurement probe is optically adjusted to match the height of the object to be measured quickly, which eliminates one dimensional movement of the probe and greatly improves the productivity.

    Abstract translation: 公开了一种光学探针系统,其能够对工程物体进行高速,高精度和高分辨率的3D数字化。 使用具有改进的速度,空间分辨率和深度范围的扫描源光学相干断层扫描系统来测量工程物体的3D尺寸数据。 还公开了一种能够执行工程物体的高速,高分辨率和非接触式测量的坐标测量机(CMM)。 传统三坐标测量机的触发式探头中的机械手针被可重新配置直径和长度的光学手写笔取代。 从光学触控笔中心到测量探头的距离可通过光学方式进行调节,以便快速匹配待测物体的高度,这样可以消除探头的一维运动,并大大提高生产率。

    MONOLITHIC OPTICAL MOUNTING ELEMENT
    8.
    发明申请
    MONOLITHIC OPTICAL MOUNTING ELEMENT 审中-公开
    单片光学安装元件

    公开(公告)号:WO2016196326A1

    公开(公告)日:2016-12-08

    申请号:PCT/US2016/034743

    申请日:2016-05-27

    Applicant: THORLABS, INC.

    CPC classification number: G02B7/1825 G02B7/181

    Abstract: A monolithic optical mount having a bore for accommodating an optical element, the bore including: a first ridge located at a first position on the inside circumference of the bore; a second ridge located at a second position on the inside circumference of the bore; and a flexure extending from along the inside circumference of the bore to a point beyond a threaded hole which passes through from the outside circumference of the bore to the inside circumference of the bore; wherein the flexure is actuated by turning a screw in the threaded hole thereby adjusting an amount of force pushing against a point on the flexure by a tip of the screw.

    Abstract translation: 一种具有用于容纳光学元件的孔的单片光学座,所述孔包括:位于所述孔的内圆周上的第一位置处的第一脊; 位于所述孔的内周上的第二位置处的第二脊; 以及从所述孔的内周延伸到超过从所述孔的外圆周穿过所述孔的内周的螺纹孔的点的挠曲; 其中通过转动螺纹孔中的螺钉来致动挠曲,从而通过螺钉的尖端调节推动挠曲件上的点的力的量。

Patent Agency Ranking