公开(公告)号：US20160169740A1

公开(公告)日：2016-06-16

申请号：US14964956

申请日：2015-12-10

Applicant: Thorlabs, Inc.

Inventor： James Jiang ,  Marshall Scott ,  Eric Geoffrion ,  Alex Cable

IPC: G01J3/427 ,  G01J3/10

CPC classification number: G01J3/36 ,  G01J3/433 ,  G01J3/4338 ,  G01N21/1702 ,  G01N21/39 ,  G01N2201/06113 ,  G01N2201/0691 ,  G01N2201/12

Abstract: A system capable of highly sensitive measurement of material concentration values in a sample using an optical spectroscopic method is disclosed. The system utilizes high-speed data acquisition and high resolution sampling of the raw signals output by the sensors with reduced total channel counts, and performs frequency analysis of the signals using the Fourier transform method to process all sensor channels in parallel. When each sensor is targeting the detection of some certain materials at some certain frequencies, the system is capable of simultaneous detection of multiple materials of interest in the sample with high measurement sensitivity and high speed.

Abstract translation: 公开了一种能够使用光学分光法对样品中的材料浓度值进行高灵敏度测量的系统。 该系统利用传感器输出的原始信号进行高速数据采集和高分辨率采样，总信道数减少，并使用傅里叶变换方法对信号进行频率分析，并行处理所有传感器通道。 当每个传感器以某些特定频率对某些材料进行检测时，系统能够以高测量灵敏度和高速度同时检测样品中感兴趣的多种材料。

公开(公告)号：US10168212B2

公开(公告)日：2019-01-01

申请号：US14964956

申请日：2015-12-10

Applicant: Thorlabs, Inc.

Inventor： James Jiang ,  Marshall Scott ,  Eric Geoffrion ,  Alex Cable

IPC: G01J3/36 ,  G01J3/433 ,  G01N21/17 ,  G01N21/39

Abstract: A system capable of highly sensitive measurement of material concentration values in a sample using an optical spectroscopic method is disclosed. The system utilizes high-speed data acquisition and high resolution sampling of the raw signals output by the sensors with reduced total channel counts, and performs frequency analysis of the signals using the Fourier transform method to process all sensor channels in parallel. When each sensor is targeting the detection of some certain materials at some certain frequencies, the system is capable of simultaneous detection of multiple materials of interest in the sample with high measurement sensitivity and high speed.