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公开(公告)号:US12148796B2
公开(公告)日:2024-11-19
申请号:US18235358
申请日:2023-08-18
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first contact plug between the first epitaxial layer and the second epitaxial layer, a third epitaxial layer and a fourth epitaxial layer adjacent to another side of the first gate structure, and a second contact plug between the third epitaxial layer and the fourth epitaxial layer. Preferably, a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug and a bottom surface of the third epitaxial layer is lower than a bottom surface of the second contact plug.
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公开(公告)号:US20220165844A1
公开(公告)日:2022-05-26
申请号:US17670528
申请日:2022-02-14
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first contact plug between the first epitaxial layer and the second epitaxial layer, a third epitaxial layer and a fourth epitaxial layer adjacent to another side of the first gate structure, and a second contact plug between the third epitaxial layer and the fourth epitaxial layer. Preferably, a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug and a bottom surface of the third epitaxial layer is lower than a bottom surface of the second contact plug.
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公开(公告)号:US11764261B2
公开(公告)日:2023-09-19
申请号:US17670528
申请日:2022-02-14
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
CPC classification number: H01L29/0649 , H01L29/7851
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first contact plug between the first epitaxial layer and the second epitaxial layer, a third epitaxial layer and a fourth epitaxial layer adjacent to another side of the first gate structure, and a second contact plug between the third epitaxial layer and the fourth epitaxial layer. Preferably, a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug and a bottom surface of the third epitaxial layer is lower than a bottom surface of the second contact plug.
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公开(公告)号:US11289572B1
公开(公告)日:2022-03-29
申请号:US17100963
申请日:2020-11-23
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
IPC: H01L29/66 , H01L21/8238 , H01L29/165 , H01L29/45 , H01L21/02 , H01L27/092 , H01L29/08 , H01L29/06 , H01L29/78
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first contact plug between the first epitaxial layer and the second epitaxial layer, a third epitaxial layer and a fourth epitaxial layer adjacent to another side of the first gate structure, and a second contact plug between the third epitaxial layer and the fourth epitaxial layer. Preferably, a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug and a bottom surface of the third epitaxial layer is lower than a bottom surface of the second contact plug.
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公开(公告)号:US20250040198A1
公开(公告)日:2025-01-30
申请号:US18917997
申请日:2024-10-16
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first fin-shaped structure between the first epitaxial layer and the substrate, and a first contact plug between the first epitaxial layer and the second epitaxial layer. Preferably, the first gate structure includes a gate dielectric layer, top surfaces of the gate dielectric layer and the first fin-shaped structure are coplanar, and a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug.
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公开(公告)号:US20230395657A1
公开(公告)日:2023-12-07
申请号:US18235358
申请日:2023-08-18
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Cheng-Pu Chiu , Tzung-Ying Lee , Dien-Yang Lu , Chun-Kai Chao , Chun-Mao Chiou
CPC classification number: H01L29/0649 , H01L29/7851
Abstract: A semiconductor device includes a substrate having a logic region and a high-voltage (HV) region, a first gate structure on the HV region, a first epitaxial layer and a second epitaxial layer adjacent to one side of the first gate structure, a first contact plug between the first epitaxial layer and the second epitaxial layer, a third epitaxial layer and a fourth epitaxial layer adjacent to another side of the first gate structure, and a second contact plug between the third epitaxial layer and the fourth epitaxial layer. Preferably, a bottom surface of the first epitaxial layer is lower than a bottom surface of the first contact plug and a bottom surface of the third epitaxial layer is lower than a bottom surface of the second contact plug.
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