公开(公告)号：EP3036532A4

公开(公告)日：2017-04-05

申请号：EP14838637

申请日：2014-08-08

Applicant: UNITED TECHNOLOGIES CORP

Inventor： DAUTOVA LYUTSIA ,  TWELVES JR WENDELL V ,  OTT JOE ,  BUTCHER EVAN ,  SCHIRTZINGER GARY A ,  HERBERT RAINER J

IPC: G01N23/20 ,  B22F3/105 ,  B22F5/04 ,  F01D21/00 ,  G01L1/25

CPC classification number: G01L1/25 ,  B22F3/1055 ,  B22F5/04 ,  B22F2003/1056 ,  B23K26/342 ,  B23K26/702 ,  B23K2203/14 ,  B33Y10/00 ,  B33Y40/00 ,  F01D21/003 ,  G01N23/20 ,  Y02P10/295

Abstract: A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. Then, the residual stress of the component is measured at a location corresponding with the marker material using x-ray techniques.

Abstract translation: 监测部件的表面和近表面区域中的残余应力的方法包括识别组件的表面上预期在部件的正常操作条件期间经受高应力的预定位置。 在预定位置的组件的添加制造期间将标记颗粒引入组分中。 然后，使用x射线技术在与标记材料相对应的位置处测量部件的残余应力。