公开(公告)号：US4986658B1

公开(公告)日：1996-06-25

申请号：US34174889

申请日：1989-04-21

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01N21/63

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/28 ,  G01J3/2889 ,  G01J2003/1828 ,  G01N21/718 ,  G01N2021/695

公开(公告)号：CS198190A3

公开(公告)日：1992-01-15

申请号：CS198190

申请日：1990-04-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：ZA902481B

公开(公告)日：1991-01-30

申请号：ZA902481

申请日：1990-03-30

Applicant: UNIV LEHIGH

Inventor： KIM YONG W ,  YONG W KIM

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：PL164530B1

公开(公告)日：1994-08-31

申请号：PL28486690

申请日：1990-04-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01N21/63 ,  G01N33/20

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：HUT61842A

公开(公告)日：1993-03-01

申请号：HU375490

申请日：1990-04-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J3/36 ,  G01N21/63

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：ZA9002481B

公开(公告)日：1991-01-30

申请号：ZA9002481

申请日：1990-03-30

Applicant: UNIV LEHIGH

Inventor： KIM YONG W ,  YONG W KIM

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/28 ,  G01J3/2889 ,  G01J2003/1828 ,  G01N21/718 ,  G01N2021/695

公开(公告)号：ES2121752T3

公开(公告)日：1998-12-16

申请号：ES90907995

申请日：1990-04-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：IN176761B

公开(公告)日：1996-09-07

申请号：IN206MA1990

申请日：1990-03-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/00

公开(公告)号：BR9007307A

公开(公告)日：1992-03-24

申请号：BR9007307

申请日：1990-04-20

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J3/36 ,  G01N21/63

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

公开(公告)号：FI914935A0

公开(公告)日：1991-10-18

申请号：FI914935

申请日：1991-10-18

Applicant: UNIV LEHIGH

Inventor： KIM YONG W

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J

Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.