MEASUREMENT APPARATUS AND METHOD
    1.
    发明申请
    MEASUREMENT APPARATUS AND METHOD 审中-公开
    测量装置和方法

    公开(公告)号:WO2013076475A1

    公开(公告)日:2013-05-30

    申请号:PCT/GB2012/052873

    申请日:2012-11-21

    Abstract: A measurement system (5) comprises a radiation source (10) and a detection system (15), wherein the radiation source is arranged such that radiation from the radiation source is incident on a sample (25) and the detection system is configured to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample. A prop¬ erty of the sample may be determined based on at least the first and second measurements.

    Abstract translation: 测量系统(5)包括辐射源(10)和检测系统(15),其中所述辐射源被布置成使得来自所述辐射源的辐射入射到样品(25)上,并且所述检测系统被配置为接收 经由样品的辐射的至少一部分,其中该系统是可重构的,以便改变辐射穿过样品的路径长度和/或至少一个表面的反射率,在至少一个表面上通过至少一个表面 部分样本。 可以至少基于第一和第二测量来确定样品的适宜性。

    MEASUREMENT APPARATUS AND METHOD
    2.
    发明公开
    MEASUREMENT APPARATUS AND METHOD 审中-公开
    MESSVORRICHTUNG外展

    公开(公告)号:EP2783199A1

    公开(公告)日:2014-10-01

    申请号:EP12798800.4

    申请日:2012-11-21

    Abstract: A measurement system (5) comprises a radiation source (10) and a detection system (15), wherein the radiation source is arranged such that radiation from the radiation source is incident on a sample (25) and the detection system is configured to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample. A prop¬ erty of the sample may be determined based on at least the first and second measurements.

    Abstract translation: 测量系统(5)包括辐射源(10)和检测系统(15),其中所述辐射源被布置成使得来自所述辐射源的辐射入射到样本(25)上,并且所述检测系统被配置为接收 经由样品的至少部分辐射,其中所述系统是可重新配置的,以便改变所述辐射穿过所述样品的路径长度和/或至少一个表面的反射率,所述至少一个表面在经过至少 部分样本。 可以至少基于第一和第二测量来确定样品的性质。

Patent Agency Ranking