Abstract:
The present invention solves the stitching problem and the problem of a predetermine integer number of grating lines per closed circle of a cylindrical grating by resorting to a novel phase mask method which proposes to geometrically transform and to optically transfer a standard planar radial grating pattern (1) into a cylindrical photoresist pattern (9) at the circularly cylindrical wall (7) of a given element (3). The planar radial grating pattern can be easily written with an integer number of lines having strictly constant period without any stitching problem by means of the available tools of planar technologies such as a laser or electron beam generator and reactive ion etching. The photolithographic transfer is made by illumination means (19) which permit the needed geometrical transformation from a planar radial grating to a circularly cylindrical grating, in particular by providing a cylindrical wave having a non-zero axial component and the same central axis (A) as said circularly cylindrical wall or a spherical wave (B) with its center on this central axis.