公开(公告)号：WO2009092864A3

公开(公告)日：2009-09-24

申请号：PCT/FI2009050058

申请日：2009-01-23

Applicant: WALLAC OY ,  HARJU RAIMO ,  KIVELAE PETRI ,  LAITINEN JYRKI ,  SALMELAINEN PAULI ,  SARMAALA JARKKO

Inventor： HARJU RAIMO ,  KIVELAE PETRI ,  LAITINEN JYRKI ,  SALMELAINEN PAULI ,  SARMAALA JARKKO

IPC: G01N21/64 ,  G01J3/44

CPC classification number: G01N21/6452 ,  G01J3/4406 ,  G01N2021/6417 ,  G01N2021/6463 ,  G01N2021/6484

Abstract: The invention concerns a measurement system and method for optical spectroscopic measurement of samples, in particular fluorescence spectroscopic measurements. The system comprises an illumination source (101, 102, 103) for forming a primary light beam, a first tunable monochromator (106) for spectrally filtering the primary light beam, a sample-receiving zone (109, 114) to which the spectrally filtered primary beam is directed for producing a secondary light beam affected by a sample in the sample receiving zone, and a second tunable monochromator (124) for spectrally filtering the secondary light beam, and a detector (130) for measuring the intensity of the spectrally filtered secondary beam. In particular, the system is adapted to scan a predefined wavelength range using one of the monochromators and totune the other monochromator sequentially to one of at least two predefined separate wavelengths in order to eliminate the effect of undesired diffraction orders of the second monochromator on the measurement. The invention allows for eliminating the use of optical diffraction order filters on the emission side of a fluorescence measurement system.

Abstract translation: 本发明涉及用于光谱测量样品的测量系统和方法，特别是荧光光谱测量。 该系统包括用于形成初级光束的照明源（101,102,103），用于对初级光束进行光谱滤波的第一可调谐单色仪（106），频谱滤波的样本接收区（109,114） 主光束被引导用于产生受样本接收区域中的样本影响的二次光束，以及用于对二次光束进行光谱滤波的第二可调谐单色仪（124），以及用于测量光谱滤波器的强度的检测器（130） 次梁。 特别地，该系统适于使用单色仪中的一个扫描预定波长范围，并将另一个单色仪顺序地调谐到至少两个预定义的单独波长中的一个，以消除第二单色仪的不希望的衍射级对测量的影响 。 本发明允许消除在荧光测量系统的发射侧使用光学衍射级滤光器。

公开(公告)号：CA2707739A1

公开(公告)日：2009-06-18

申请号：CA2707739

申请日：2008-12-11

Applicant: WALLAC OY

Inventor： SARMAALA JARKKO

IPC: G02B7/00

Abstract: The present invention provides a device (100) for adjusting a position of an optical component in two directions. The device comprises a first member (110) having a flat sliding surface (111), and a second member (120) arranged to be movable relative to the first member in contact with said sliding surface. The optical component can be attached to the second member. The device also comprises an elongated third member (130) arranged in an operational connection with the first and the second member so that the second member is movable relative to the first member in a direction of a rotation axis of the third member when the third member is being moved in the direction of its rotation axis.The rotation axis is arranged to be substantially parallel to the sliding surface of the first member. The third member comprises an eccentric part (132) which is eccentric in relation to the rotation axis of the third member. The eccentric part is arranged in an operational connection with the second member so that the second member is movable relative to the first member in a direction perpendicular to said rotation axis when the third member is being rotated around its rotation axis.The invention also provides a method for adjusting a position of an optical component in two directions.

公开(公告)号：AU2008334515A1

公开(公告)日：2009-06-18

申请号：AU2008334515

申请日：2008-12-11

Applicant: WALLAC OY

Inventor： SARMAALA JARKKO

IPC: G02B7/00

Abstract: An bidirectional optical component position adjustment device includes a first member having a flat sliding surface, and a second member movable relative to the first member contacting the sliding surface. The optical component attaches to the second member. An elongated third member connects with the first and second members so the second member is movable relative to the first in a direction of a rotation axis of the third member when the third member is moved in the direction of its rotation axis. The rotation axis is substantially parallel to the sliding surface. The third member includes an eccentric part which is eccentric in relation to the rotation axis. The eccentric part is operationally connected with the second member so the second member moves relative to the first perpendicular to the rotation axis when the third member is rotated around its rotation axis. An optical adjustment method is also provided.

公开(公告)号：FI20095064A0

公开(公告)日：2009-01-26

申请号：FI20095064

申请日：2009-01-26

Applicant: WALLAC OY

Inventor： LAITINEN JYRKI ,  OJALA MARKKU ,  SARMAALA JARKKO ,  ISAKSSON CHRISTER

IPC: G01N20090101

Abstract: An optical measurement instrument includes a measurement head and mechanical support elements arranged to support a sample well plate. The measurement head is moved towards the sample well plate and, after the measurement head has touched the sample well plate, the measurement head is moved backwards away from the sample well plate so as to provide a desired distance between the measurement head and the sample well plate. A sensor device is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample well plate. Hence, the situation in which the measurement head touches the sample well plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.

公开(公告)号：CA2748731C

公开(公告)日：2017-06-27

申请号：CA2748731

申请日：2010-01-18

Applicant: WALLAC OY

Inventor： LAITINEN JYRKI ,  OJALA MARKKU ,  SARMAALA JARKKO ,  ISAKSSON CHRISTER

IPC: G01N35/00 ,  G01N21/13

Abstract: An optical measurement instrument comprises a measurement head (101) and mechanical support elements (102, 103) arranged to support a sample plate (106). The measurement head is moved towards the sample plate and, after the measurement head has touched the sample plate, the measurement head is moved backwards away from the sample plate so as to provide a desired distance between the measurement head and the sample plate. A sensor device (112, 113) is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample plate. Hence, the situation in which the measurement head touches the sample plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.

公开(公告)号：FI20085062A0

公开(公告)日：2008-01-25

申请号：FI20085062

申请日：2008-01-25

Applicant: WALLAC OY

Inventor： HARJU RAIMO ,  KIVELAE PETRI ,  LAITINEN JYRKI ,  SALMELAINEN PAULI ,  SARMAALA JARKKO

IPC: G01N20060101

公开(公告)号：FI20070971A0

公开(公告)日：2007-12-12

申请号：FI20070971

申请日：2007-12-12

Applicant: WALLAC OY

Inventor： SARMAALA JARKKO

IPC: G02B20060101

公开(公告)号：FI20080053A0

公开(公告)日：2008-01-22

申请号：FI20080053

申请日：2008-01-22

Applicant: WALLAC OY

Inventor： SARMAALA JARKKO

IPC: G02B20060101

Abstract: An bidirectional optical component position adjustment device includes a first member having a flat sliding surface, and a second member movable relative to the first member contacting the sliding surface. The optical component attaches to the second member. An elongated third member connects with the first and second members so the second member is movable relative to the first in a direction of a rotation axis of the third member when the third member is moved in the direction of its rotation axis. The rotation axis is substantially parallel to the sliding surface. The third member includes an eccentric part which is eccentric in relation to the rotation axis. The eccentric part is operationally connected with the second member so the second member moves relative to the first perpendicular to the rotation axis when the third member is rotated around its rotation axis. An optical adjustment method is also provided.

公开(公告)号：CA2748731A1

公开(公告)日：2010-07-29

申请号：CA2748731

申请日：2010-01-18

Applicant: WALLAC OY

Inventor： LAITINEN JYRKI ,  OJALA MARKKU ,  SARMAALA JARKKO ,  ISAKSSON CHRISTER

IPC: G01N35/00 ,  G01N21/13

Abstract: An optical measurement instrument comprises a measurement head (101 ) and mechanical support elements (102, 103) arranged to support a sample plate (106). The measurement head is moved towards the sample plate and, after the measurement head has touched the sample plate, the measurement head is moved backwards away from the sample plate so as to provide a desired distance between the measurement head and the sample plate. A sensor device (112, 113) is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample plate. Hence, the situation in which the measurement head touches the sample plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.