公开(公告)号：US20220121919A1

公开(公告)日：2022-04-21

申请号：US17072941

申请日：2020-10-16

Applicant: X Development LLC

Inventor： Zhiqiang Yuan ,  Theodore Monyak

IPC: G06N3/08 ,  G06K9/00 ,  G01N33/10 ,  G01N33/00

Abstract: Techniques are disclosed that enable generating a predicted yield for a cereal grain crop based on one or more traits extracted from image(s) of the cereal grain crop. Various implementations include determining a heading trait value based on the number of identified spikelets, where the spikelets are identified by processing the image(s) of the cereal grain crop using a spikelet detection model. Additional or alternative implementations include generating a predicted cereal grain crop yield based on one or more additional or alternative trait values such as one or more heading values, one or more projected leaf area values, one or more stand spacing values, one or more wheat rust values, one or more maturity detection values, one or more intercropping phenotyping values extracted cereal grains intercropped with other crops, one or more additional or alternative trait output values, and/or combinations thereof.