Abstract:
PROBLEM TO BE SOLVED: To provide an ESD protection circuit using an output buffer, capable of protecting satisfactorily a prestage circuit such as a prebuffer, without providing a dedicated element for making a surge current flow when applying an ESD surge. SOLUTION: The ESD protection circuit includes: the prebuffer 10 operated in response to an input signal IN; an output buffer 20 with an electric power source shared with the prebuffer 10, and operated based on an output from the prebuffer 10, to drive a load; and a protection function-effectuating circuit 30, operated when applying the ESD surge to the electric power source, and for turning the output buffer 20 on, to absorb the surge current by the output buffer. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a highly precise pull-up/pull-down circuit capable of highly precisely matching a pul-up current and a pull-down current with each other in their values. SOLUTION: The highly precise pull-up/pull-down circuit 1 comprises P-channel transistors TP1, TP2, N-channel transistors TN1, TN2, a reference voltage source 11, and a control circuit 12. The control circuit 12 adopts a configuration of an operational amplifier circuit, a voltage Vref at nodes NA, NB is given to a negative (-) input terminal, and the feedback configuration controls a voltage at a connecting point (point C) between the P-channel transistor TP2 and the N-channel transistor TN2 to be equal to the voltage Vref. In this case, since a current Ipuo is equal to a current Ipd and the current Ipuo is accurately mirrored to the current Ipd and the current Ipdo is accurately mirrored to the current Ipd, the circuit 1 can match the pull-up current Ipu and the pull-down current Ipd with each other in their values highly precisely. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To achieve such limiter characteristics that unwanted waveform deformation does not occur. SOLUTION: A differential amplifier circuit included in a limiter circuit 10 amplifies a potential difference between a control voltage and the potential of an input signal and outputs the amplified potential difference. When the potential of the input signal exceeds the potential level of a limit voltage, current is supplied to a resistor 1 and the potential level of a node N1 is controlled not to exceed the limit voltage. Since the potential difference appears in an amplified state by using the differential amplifier circuit, when the potential of the input signal exceeds the potential level of the limit voltage, a switching element (such as an NMOS transistor 5 or a PMOS transistor 6) is speedily turned on and the current can flow to the resistor 1. Namely, ON/OFF of operation of the switching element can be accurately changed over, then, excellent limiter characteristics can be materialized. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To prevent a class D amplification circuit from clipping for a technique for performing class D amplification. SOLUTION: First and second pulse width modulation signals Pa and Pb are fed back to an operational amplification section 10 via a low-pass filter 20 as feedback signals FBa and FBb. The operational amplification section 10 composites input signals Vin+ and Vin- and the feedback signals FBa and FBb each, performs secondary integration, and generates an integral signal X. A PWM signal generation section 40 generates the first and second pulse width modulation signals Pa and Pb, based on the comparison result between a triangular signal TRI and the integral signal X. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of configuring a drive circuit for almost simultaneously switching a plurality of power MOS transistors provided in parallel connection at the output stage of a class-D amplifier. SOLUTION: A non-inverting pulse signal and an inverting pulse signal that are PWM-modulated inside the class D amplifier are applied to first and second input terminals. Input parts of a comparator are connected to the first and second input terminals, an output part of the comparator is connected to a first output terminal, an input part of a buffer is connected to a third input terminal, and its output part is connected to a second output terminal. Any gate of a plurality of the power MOS transistors provided in parallel connection to the output stage of the class D amplifier is connected to the second output terminal. The drive circuit is configured by using semiconductor devices 303H to 303HC, and 303LA to 303LC with the configuration above. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a signal change detecting circuit which is useful as an address transition detecting circuit which can independently set the optimum values of the widths of a rising edge detecting signal and a falling edge detecting signal of a pulse signal. SOLUTION: A first delay circuit 11 for producing a first delay pulse signal N1 obtained by delaying the rising edge of an address pulse signal AD and a second delay circuit 12 for producing a second delay pulse N3 obtained by delaying the falling edge of the address pulse signal AD are provided in combination. The delay circuits 11, 12 adjust amount of delay with given DC biases VCR, VCF. The first delay pulse signal N1 and address pulse signal AD are input to a first EOR gate 13 to obtain the rising edge detecting signal N2. The second delay pulse signal N3 and address pulse signal AD are input to a second EOR gate 14 to obtain the falling edge detecting signal N4. These detecting signals N2, N4 are combined with an OR gate 15 to obtain an ATD (Address Transition Detecting Circuit) signal.
Abstract:
PROBLEM TO BE SOLVED: To be able to directly detect damage to an element being monitored.SOLUTION: Monitoring wiring is installed in the vicinity of a semiconductor element being monitored. Clock output means for outputting a predetermined clock is connected to one end of the monitoring wiring, and monitoring means is connected to the other end of the monitoring wiring. The monitoring means is caused to monitor propagation of the clock output from the clock output means to the monitoring wiring. When it is detected that propagation of the clock has ceased, the monitoring means is caused to output a damage notification signal notifying that the semiconductor element being monitored has been damaged.
Abstract:
PROBLEM TO BE SOLVED: To provide a reference voltage generating circuit maintaining stable operation even if voltage Vt required for turning on a transistor constituting a start-up circuit is relatively high. SOLUTION: In the reference voltage generating circuit, potential of a node N5 is input into a gate of an NMOS transistor 33 included in the start-up circuit 30a simultaneously with power-on. The potential of the node N5 becomes higher than an output node N1 by potential difference generated by a resistor 43. Therefore, when the value of the resistor 43 is set so as to exceed Vt of the NMOS transistor 33 before the potential of the output node N1 becomes an essential reference voltage, even if the Vt of the transistor 33 constituting the start-up circuit is relatively high, the reference voltage generating circuit does not output voltage exceeding the reference voltage, and can promptly start and stably maintain the reference voltage. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a tracking servo circuit, in which the comparative accuracy of laser beams for the follow-up detection is improved and the tracking servo for reading data is performed at a high speed by effectively removing the component of a superimposing offset voltage VOFF from a detected signal OUT. SOLUTION: This servo circuit for an optical pickup, which makes the laser beams exactly converge on a pit of the optical disk, has a feature that a VCA.10 for amplifying a reflected signal IN based on the reflection of the laser beams in accordance with the voltage of a trigger signal FB, a VCA.50 for operating the amplification based on the trigger signal FB while being constituted similarly to the VCA.10, and a differential amplifier 54 for outputting the voltage of the difference between an amplified voltage V outputted by the VCA.10 and an amplified voltage VOFFD' outputted by the VCA.50, as a detection signal OUT of the laser beams, are furnished therein. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To efficiently execute the reading and writing (refreshing) of data by eliminating a special period for precharging. SOLUTION: This circuit is provided with memory cells which store charge corresponding to levels of bit lines Bit by instructions of write word lines WWrd at the time of write-in and on the other hand which transit levels of the bit lines Bit corresponding to the stored charge by instructions of read word lines RWrd at the time of readout, transistors 11 connecting the bit lines Bit to a power source voltage Vdd at the time of readout, an inverter 12 reading out data written in the memory cells by whether the levels of the bit lines Bit are transited from pull-up levels or not at the time of readout and an inverter 15 which selects read out data or data which are to be newly written by selectors 14 and transits the levels of the bit lines Bit to the levels corresponding to the data.