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公开(公告)号:EP2276056A2
公开(公告)日:2011-01-19
申请号:EP10176305.0
申请日:2002-06-17
Applicant: Yeda Research And Development Company Ltd.
Inventor: Zajfman, Daniel , Heber, Oded , Pedersen, Henrik B. , Rudich, Yinon , Sagi, Irit , Rappaport, Michael
IPC: H01J49/40
CPC classification number: H01J3/40 , H01J49/027 , H01J49/406 , H01J49/4245
Abstract: A charged particle trap for trapping of a plurality of charged particles, and a method of operating said trap. The trap includes first and second electrode mirrors (2,3) having a common optical axis (4), the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam (10) having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.
Abstract translation: 用于捕获多个带电粒子的带电粒子捕获器以及操作所述捕获器的方法。 该陷阱包括具有公共光轴(4)的第一和第二电极镜(2,3),这些镜在其两个末端排列成对齐。 当施加电压时,反射镜能够产生由关键场参数定义的相应电场。 电场被配置为反射带电粒子,引起它们在镜子之间的振荡。 该方法包括沿着光轴将多个带电粒子作为具有预定关键射束参数的射束(10)引入陷阱。 该方法还包括选择用于至少一个反射镜的关键场参数,以便诱导射束中带电粒子之间的聚束。
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公开(公告)号:EP2276056A3
公开(公告)日:2011-01-26
申请号:EP10176305.0
申请日:2002-06-17
Applicant: Yeda Research And Development Company Ltd.
Inventor: Zajfman, Daniel , Heber, Oded , Pedersen, Henrik B. , Rudich, Yinon , Sagi, Irit , Rappaport, Michael
IPC: H01J49/40
CPC classification number: H01J3/40 , H01J49/027 , H01J49/406 , H01J49/4245
Abstract: A charged particle trap for trapping of a plurality of charged particles, and a method of operating said trap. The trap includes first and second electrode mirrors (2,3) having a common optical axis (4), the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam (10) having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.
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