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公开(公告)号：US20120179369A1
公开(公告)日：2012-07-12
申请号：US13396306
申请日：2012-02-14
Applicant: Zvi Lapidot , Abraham Aharoni
Inventor： Zvi Lapidot , Abraham Aharoni
IPC: G01C21/00
CPC classification number: G06F3/012 , G01C23/00 , G02B27/017 , G02B2027/014 , G02B2027/0187 , G06F1/163
Abstract: There is provided a personal navigation system, including a head-mounted orientation sensor, a coordinate position sensor, a head-mounted display, and a processor receiving an input from the head-mounted orientation sensor and an input from the coordinate position sensor and providing a visually sensible output for displaying on the head-mounted display.
Abstract translation: 提供了一种个人导航系统，包括头戴式定向传感器，坐标位置传感器，头戴式显示器和从头戴式定向传感器接收输入的处理器和来自坐标位置传感器的输入，并提供 用于在头戴式显示器上显示的视觉敏感的输出。
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2.发明授权Method of and means for inspecting workpieces traveling along a production line 失效检查沿着生产线行进的工件的方法和装置
公开(公告)号：US4758888A
公开(公告)日：1988-07-19
申请号：US15070
申请日：1987-02-17
Applicant: Zvi Lapidot
Inventor： Zvi Lapidot
IPC: G01N21/88 , G01N21/89 , G01N21/956 , H04N7/18
CPC classification number: G01N21/88 , G01N2021/8887 , G01N2021/889 , G01N2021/95615 , G01N2201/102
Abstract: Inspection of workpieces traveling along a production line includes on-line inspection of the workpieces at an upstream inspection station to detect possible flaws without interrupting the progression of workpieces along the production line. Possible flaws in the inspected workpieces are imaged, and images of possible flaws are stored in a memory in a way that associates a stored image with the workpiece containing the possible flaw. Off-line, a stored image is retrieved from the memory before the workpiece with which the image is associated reaches a downstream sorting station. The retrieved image is displayed on a monitor for verifying, by visual inspection, whether the possible flaw in the workpiece with which the retrieved image is associated, is valid. Workpieces are diverted at the downstream sorting station in response to vertification of flaws.
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公开(公告)号：US20100171680A1
公开(公告)日：2010-07-08
申请号：US12602643
申请日：2008-06-01
Applicant: Zvi Lapidot , Yaakov Amitai , Shmuel Friedman
Inventor： Zvi Lapidot , Yaakov Amitai , Shmuel Friedman
IPC: G09G5/00
CPC classification number: G02B27/0172 , G02B6/00 , G02B27/017
Abstract: There is provided an electro-optical system, including at least two spaced-apart units, a head-mounted display (HIVID) unit, having a video signal source, a display source for displaying video signals from the display source, an optical module for projecting video signals from the display source into a user's eye, a driving electronic module, a power supply, and a portable control unit. The two spaced-apart units communicate by a narrowband wireless channel.
Abstract translation: 提供了一种电光系统，包括至少两个间隔开的单元，具有视频信号源的头戴式显示器（HIVID）单元，用于显示来自显示源的视频信号的显示源，用于 将来自显示源的视频信号投影到用户的眼睛中，驱动电子模块，电源和便携式控制单元。 两个间隔开的单元通过窄带无线信道进行通信。
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公开(公告)号：US07016526B2
公开(公告)日：2006-03-21
申请号：US10003347
申请日：2001-12-06
Applicant: Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
Inventor： Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
IPC: G06K9/00
CPC classification number: G01N21/94 , G01N21/9501
Abstract: A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer, collecting the signature of each pixel, defined by the way in which it responds to the light of a scanning beam, and determining whether the signature is that of a faultless pixel or of a pixel that is defective or suspect to be defective. An apparatus is also provided for the determination of such defects, which comprises a stage for supporting a wafer, a laser source generating a beam that is directed onto the wafer, collecting optics and photoelectric sensors for collecting the laser light scattered by the wafer in a number of directions and generating corresponding analog signals, an A/D converter deriving from said signals digital components defining pixel signatures, and selection systems for identifying the signatures of suspect pixels and verifying whether the suspect pixels are indeed defective.
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公开(公告)号：USRE38716E1
公开(公告)日：2005-03-22
申请号：US09607318
申请日：2000-06-30
Applicant: Amiram Caspi , Zvi Lapidot
Inventor： Amiram Caspi , Zvi Lapidot
CPC classification number: G06T7/0004 , G06T3/403 , G06T7/12 , G06T2200/28 , G06T2207/30141
Abstract: A binary map of an object having edges is produced by first producing a digital grey scale image of the object with a given resolution, and processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution. Processing of the grey scale image includes the step of convolving the 2-dimensional digital grey scale image with a filter function related to the second derivative of a Gaussian function forming a 2-dimensional convolved image having signed values. The location of an edge in the object is achieved by finding zero crossings between adjacent oppositely signed values. Preferably, the zero crossings are achieved by an interpolation process that produces a binary bit map of the object at a resolution greater than the resolution of the grey scale image. The nature of the Gaussian function whose second derivative is used in the convolution with the grey scale image, namely its standard deviation, is empirically selected in accordance with system noise and the pattern of the traces on the printed circuit board such that the resulting bit map conforms as closely as desired to the lines on the printed circuit board.
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Patent Agency Ranking
公开(公告)号：US07454052B2
公开(公告)日：2008-11-18
申请号：US11042509
申请日：2005-01-26
Applicant: Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
Inventor： Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
CPC classification number: G01N21/94 , G01N21/9501
Abstract: A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer, collecting the signature of each pixel, defined by the way in which it responds to the light of a scanning beam, and determining whether the signature is that of a faultless pixel or of a pixel that is defective or suspect to be defective. An apparatus is also provided for the determination of such defects, which comprises a stage for supporting a wafer, a laser source generating a beam that is directed onto the wafer, collecting optics and photoelectric sensors for collecting the laser light scattered by the wafer in a number of directions and generating corresponding analog signals, an A/D converter deriving from the signals digital components defining pixel signatures, and selection systems for identifying the signatures of suspect pixels and verifying whether the suspect pixels are indeed defective.
Abstract translation: 提供一种通过检查晶片上的各个像素来检测半导体晶片上的缺陷的方法，收集由其响应于扫描光束的光的方式限定的每个像素的签名，以及确定该签名是否为 无缺陷像素或缺陷或怀疑有缺陷的像素。 还提供了一种用于确定这种缺陷的装置，其包括用于支撑晶片的台，产生被引导到晶片上的光束的激光源，收集光学器件和用于收集由晶片散射的激光的光电传感器 方向数量并产生相应的模拟信号，从定义像素特征的信号数字分量得到的A / D转换器，以及用于识别可疑像素的签名的选择系统，并验证可疑像素是否确实是有缺陷的。
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公开(公告)号：US20050129303A1
公开(公告)日：2005-06-16
申请号：US11042509
申请日：2005-01-26
Applicant: Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
Inventor： Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
IPC: G01N21/956 , G01N21/88 , G01N21/94 , G06K9/00
CPC classification number: G01N21/94 , G01N21/9501
Abstract: A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer, collecting the signature of each pixel, defined by the way in which it responds to the light of a scanning beam, and determining whether the signature is that of a faultless pixel or of a pixel that is defective or suspect to be defective. An apparatus is also provided for the determination of such defects, which comprises a stage for supporting a wafer, a laser source generating a beam that is directed onto the wafer, collecting optics and photoelectric sensors for collecting the laser light scattered by the wafer in a number of directions and generating corresponding analog signals, an A/D converter deriving from the signals digital components defining pixel signatures, and selection systems for identifying the signatures of suspect pixels and verifying whether the suspect pixels are indeed defective.
Abstract translation: 提供一种通过检查晶片上的各个像素来检测半导体晶片上的缺陷的方法，收集由其响应于扫描光束的光的方式限定的每个像素的签名，以及确定该签名是否为 无缺陷像素或缺陷或怀疑有缺陷的像素的像素。 还提供了一种用于确定这种缺陷的装置，其包括用于支撑晶片的台，产生被引导到晶片上的光束的激光源，收集光学器件和用于收集由晶片散射的激光的光电传感器 方向数量并产生相应的模拟信号，从定义像素特征的信号数字分量得到的A / D转换器，以及用于识别可疑像素的签名的选择系统，并验证可疑像素是否确实是有缺陷的。
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公开(公告)号：US20050129302A1
公开(公告)日：2005-06-16
申请号：US11042084
申请日：2005-01-26
Applicant: Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
Inventor： Zeev Smilansky , Sagie Tsadka , Zvi Lapidot , Rivi Sherman
IPC: G01N21/956 , G01N21/88 , G01N21/94 , G06K9/00
CPC classification number: G01N21/94 , G01N21/9501
Abstract: A method is provided for the detection of defects on a semiconductor wafer by checking individual pixels on the wafer, collecting the signature of each pixel, defined by the way in which it responds to the light of a scanning beam, and determining whether the signature is that of a faultless pixel or of a pixel that is defective or suspect to be defective. An apparatus is also provided for the determination of such defects, which comprises a stage for supporting a wafer, a laser source generating a beam that is directed onto the wafer, collecting optics and photoelectric sensors for collecting the laser light scattered by the wafer in a number of directions and generating corresponding analog signals, an A/D converter deriving from the signals digital components defining pixel signatures, and selection systems for identifying the signatures of suspect pixels and verifying whether the suspect pixels are indeed defective.
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公开(公告)号：US08405573B2
公开(公告)日：2013-03-26
申请号：US12602643
申请日：2008-06-01
Applicant: Zvi Lapidot , Yaakov Amitai , Shmuel Friedman
Inventor： Zvi Lapidot , Yaakov Amitai , Shmuel Friedman
IPC: G09G5/00
CPC classification number: G02B27/0172 , G02B6/00 , G02B27/017
Abstract: There is provided an electro-optical system, including at least two spaced-apart units, a head-mounted display (HMD) unit, having a video signal source, a display source for displaying video signals from the display source, an optical module for projecting video signals from the display source into a user's eye, a driving electronic module, a power supply, and a portable control unit. The two spaced-apart units communicate by a narrowband wireless channel.
Abstract translation: 提供了一种电光系统，包括至少两个间隔开的单元，具有视频信号源的头戴式显示器（HMD）单元，用于显示来自显示源的视频信号的显示源，用于 将来自显示源的视频信号投影到用户的眼睛中，驱动电子模块，电源和便携式控制单元。 两个间隔开的单元通过窄带无线信道进行通信。
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公开(公告)号：US08301319B2
公开(公告)日：2012-10-30
申请号：US13396306
申请日：2012-02-14
Applicant: Zvi Lapidot , Abraham Aharoni
Inventor： Zvi Lapidot , Abraham Aharoni
CPC classification number: G06F3/012 , G01C23/00 , G02B27/017 , G02B2027/014 , G02B2027/0187 , G06F1/163
Abstract: There is provided a personal navigation system, including a head-mounted orientation sensor, a coordinate position sensor, a head-mounted display, and a processor receiving an input from the head-mounted orientation sensor and an input from the coordinate position sensor and providing a visually sensible output for displaying on the head-mounted display.
Abstract translation: 提供了一种个人导航系统，包括头戴式定向传感器，坐标位置传感器，头戴式显示器和从头戴式定向传感器接收输入的处理器和来自坐标位置传感器的输入，并提供 用于在头戴式显示器上显示的视觉敏感的输出。
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