公开(公告)号：US20180087963A1

公开(公告)日：2018-03-29

申请号：US15714454

申请日：2017-09-25

Applicant: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

Inventor： Heinrich Grueger ,  Jens Knobbe ,  Tino Puegner

IPC: G01J3/18 ,  G01J3/02 ,  G01J3/04

CPC classification number: G01J3/1804 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/06 ,  G01J2003/1885

Abstract: An optical arrangement for a spectral analysis system, a method for producing an optical arrangement for a spectral analysis system and a spectral analysis system are disclosed. In an embodiment the optical arrangement includes a carrier substrate having a placement area for a frame and a base area, and a diffraction grating movably arranged in the frame, wherein the frame is arranged on the placement area in an inclined placement position with respect to the base area so that the diffraction grating, arranged in a base position, is inclined with respect to the base area.

公开(公告)号：US4729658A

公开(公告)日：1988-03-08

申请号：US871056

申请日：1986-06-05

Applicant: Sherman K. Poultney

Inventor： Sherman K. Poultney

IPC: G01J3/18 ,  G01J3/28 ,  G01J3/36

CPC classification number: G01J3/18 ,  G01J2003/1828 ,  G01J2003/1885 ,  G01J3/2803

Abstract: A very wide spectral coverage grating spectrometer which gathers light from a scene being viewed and collimates that light. A mosaic grating is disposed in collimated space which disperses the collimated light. The dispersed light is focused onto a detector array.

Abstract translation: 一种非常宽的光谱覆盖光栅光谱仪，可以从正在观看的场景中收集光并准直光。 马赛克光栅设置在准直空间中，分散准直光。 分散的光聚焦到检测器阵列上。

公开(公告)号：US5280338A

公开(公告)日：1994-01-18

申请号：US969097

申请日：1992-10-30

Applicant: Zbigniew Drozdowicz ,  Traian Manta

Inventor： Zbigniew Drozdowicz ,  Traian Manta

IPC: G01J3/18 ,  G01J3/28 ,  G01J3/06

CPC classification number: G01J3/02 ,  G01J3/0235 ,  G01J3/18 ,  G01J2003/1885

Abstract: An improved multiple grating spectrograph is provided comprising a grating changer for mounting gratings, and rotatable about an axis substantially perpendicular to grating lines such that changing from one grating to another preserves the wavelength-selecting angle of incidence of electromagnetic radiation. The grating changer preferably includes a grating holder, and an actuator for moving the holder about the axis.

Abstract translation: 提供了一种改进的多光栅光谱仪，其包括用于安装光栅的光栅更换器，并且可绕基本上垂直于光栅线的轴线旋转，使得从一个光栅到另一个光栅的变化保持了电磁辐射的入射波长选择角。 光栅更换器优选地包括光栅保持器和用于使保持器围绕轴线移动的致动器。

公开(公告)号：US5283624A

公开(公告)日：1994-02-01

申请号：US597324

申请日：1990-10-15

Applicant: Masamichi Tsukada ,  Konosuke Oishi

Inventor： Masamichi Tsukada ,  Konosuke Oishi

IPC: G01J3/04 ,  G01J3/10 ,  G01J3/12 ,  G01J3/18 ,  G01J3/36 ,  G01N21/31 ,  G01N21/74 ,  G01J3/42 ,  G01J3/28

CPC classification number: G01J3/06 ,  G01J3/04 ,  G01N21/3103 ,  G01J2003/045 ,  G01J2003/104 ,  G01J2003/1295 ,  G01J2003/1885 ,  G01J3/36 ,  G01N2021/3114 ,  G01N21/74

Abstract: Incident slits and exit slits are provided separately on corresponding optical axes incident simultaneously on a spectroscope from a sample atomizing unit. A mechanism for changing the widths of the respective incident slits and exiting slits is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.

Abstract translation: 在样品雾化单元上同时入射到分光镜上的相应的光轴上分别设置入射狭缝和出口狭缝。 设置用于改变各个入射狭缝和出射狭缝的宽度的机构，使得对于相应的测量元件最佳的狭缝宽度被设置在相应的光轴上，从而实现所有待测元素的高灵敏度分析 。

公开(公告)号：US4775234A

公开(公告)日：1988-10-04

申请号：US945546

申请日：1986-12-23

Applicant: Teiichi Shimomura

Inventor： Teiichi Shimomura

IPC: G01J3/06 ,  G01J3/18 ,  G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0235 ,  G01J3/18 ,  G01J2003/061 ,  G01J2003/1885

Abstract: A spectroscopic measurement system comprises at least two kinds of diffraction gratings whose grating surfaces are in line, an exchange device for exchanging the positions of the two kinds of diffraction gratings in connection with incident light to be measured while the two kinds of diffraction gratings are placed in a predetermined rotation angle, at least two kinds of detectors having characteristics corresponding to those of the two kinds of diffraction gratings respectively, a light path switch for switching a path of diffraction light toward either of the two kinds of detectors, and a switch circuit for switching the detection output of the two kinds of detectors in synchronization with the exchange operation of the two kinds of diffraction gratings.

公开(公告)号：EP0271602A1

公开(公告)日：1988-06-22

申请号：EP86117744.2

申请日：1986-12-19

Applicant: SHIMADZU CORPORATION

Inventor： Shimomura, Teiichi

IPC: G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0235 ,  G01J3/18 ,  G01J2003/061 ,  G01J2003/1885

Abstract: A spectroscopic measurement system comprises at least two kinds of diffraction gratings (1,2) whose grating surfaces are in line, an exchange device (3,4) for ex­changing the positions of the two kinds of diffraction gratings (1,2) in connection with incident light to be measured while the two kinds of diffraction gratings (1,2) are placed in a predetermined rotation angle, at least two kinds of detectors (5,6) having characteristics corresponding to those of the two kinds of diffraction gratings (1,2), respectively, a light path switch (7) for switching a path of diffraction light toward either of the two kinds of detectors (5,6), and a switch circuit (9) for switching the detection output of the two kinds of detectors (5,6) in synchronization with the exchange ope­ration of the two kinds of diffraction gratings (1,2).

Abstract translation: 光谱测量系统包括至少两种其光栅表面在一起的衍射光栅（1,2），用于在连接中交换两种衍射光栅（1,2）的位置的交换装置（3,4） 在将两种衍射光栅（1,2）以预定的旋转角度放置的同时进行测量的入射光，至少两种具有与两种衍射光栅的特性相对应的特性的检测器（5,6） 1,2），分别用于将衍射光的路径切换到两种检测器（5,6）中的任一种的光路开关（7），以及用于切换两个检测器（5,6）的检测输出的开关电路（9） 各种检测器（5,6）与两种衍射光栅（1,2）的交换操作同步。

公开(公告)号：EP0423736A3

公开(公告)日：1991-12-27

申请号：EP90119853.1

申请日：1990-10-16

Applicant: HITACHI, LTD.

Inventor： Tsukada, Masamichi ,  Oishi, Konosuke

IPC: G01N21/31

CPC classification number: G01J3/06 ,  G01J3/04 ,  G01J3/36 ,  G01J2003/045 ,  G01J2003/104 ,  G01J2003/1295 ,  G01J2003/1885 ,  G01N21/3103 ,  G01N21/74 ,  G01N2021/3114

Abstract: Incident slits (W₁ - W₄) and exiting slits (W₅ - W₈) are provided separately on the corresponding optical axes (ⓐ, ⓑ, ⓒ, ⓓ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W₁ - W₄( and exiting slits (W₅ - W₈) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneous­ly.

公开(公告)号：EP0423736A2

公开(公告)日：1991-04-24

申请号：EP90119853.1

申请日：1990-10-16

Applicant: HITACHI, LTD.

Inventor： Tsukada, Masamichi ,  Oishi, Konosuke

IPC: G01N21/31

CPC classification number: G01J3/06 ,  G01J3/04 ,  G01J3/36 ,  G01J2003/045 ,  G01J2003/104 ,  G01J2003/1295 ,  G01J2003/1885 ,  G01N21/3103 ,  G01N21/74 ,  G01N2021/3114

Abstract: Incident slits (W₁ - W₄) and exiting slits (W₅ - W₈) are provided separately on the corresponding optical axes (ⓐ, ⓑ, ⓒ, ⓓ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W₁ - W₄( and exiting slits (W₅ - W₈) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneous­ly.

Abstract translation: 入射狭缝（W1 - W4）和离开狭缝（W5 - W8）分别设置在对应的光轴（A /＆CIR＆B /＆CIR＆，C /＆CIR＆，D /＆CIR＆）入射同时从一个分光镜（10） 样品雾化单元（7）。 的机构（11A - 11D，31A - 31D; 17A，17B，31E，31F），用于改变respectivement入射狭缝的宽度（W1 - W4（与出射狭缝（W5 - W8）设置检查没有狭缝宽度最佳地 要测量的相应的光轴设置，从而实现所有元件的高灵敏度分析的respectivement元素被同时测量。