公开(公告)号：EP0114431A3

公开(公告)日：1986-01-08

申请号：EP83201771

申请日：1983-12-14

Applicant: TELECOMMUNICATIONS RADIOELECTRIQUES ET TELEPHONIQUES T.R.T. ,  N.V. Philips' Gloeilampenfabrieken

Inventor： Creel, Georges Nelson ,  Morelle, Claude

IPC: G01J05/52 ,  G01M11/00

CPC classification number: H04N17/002

公开(公告)号：WO1982001248A1

公开(公告)日：1982-04-15

申请号：PCT/US1981001293

申请日：1981-09-24

Applicant: HETRA CORP

Inventor： HETRA CORP ,  HAMMOND O

IPC: G01J05/52

CPC classification number: G01N25/18

Abstract: La composition d'un echantillon (52) est determinee par reference a une valeur standard enregistree en utilisant les memes dispositifs de chauffage (56) et detecteur (58) que ceux utilises pour enregistrer la valeur standard, en analysant l'echantillon seulement lorsque sa temperature a atteint un equilibre, et en compensant les differences de temperature ambiante et initiale; une commande precise du dispositif de chauffage est assuree en maintenant une tension constante sur un circuit en serie consistant en un dispositif de chauffage (56) et une charge de resistance (81) egale a la resistance du dispositif de chauffage; le dispositif de chauffage est pulse dans une sequence de test initial pour chauffer le systeme au-dessus de la temperature ambiante de telle sorte que les pertes de chaleur a l'atmosphere soient sensiblement les memes d'un test a un autre, un systeme d'isolation dynamique (66, 68, 70) elimine les pertes de chaleur de l'echantillon en cours de test- un test ameliore base sur la temperature detectee de l'echantillon immediatement apres arret du dispositif de chauffage detecte la presence de falsification de tungstene; un detecteur a infrarouge compense (138-146) elimine le besoin d'un detecteur de temperature a contact direct; des tests permettent de determiner plusieurs caracteristiques physiques d'un echantillon inconnu.

公开(公告)号：EP0139434A3

公开(公告)日：1987-11-11

申请号：EP84306033

申请日：1984-09-03

Applicant: The Gillette Company

Inventor： Nelson, Robert Eric

IPC: H01L31/04 ,  F21H01/02 ,  G01J05/52

CPC classification number: F21H1/02 ,  H02S10/30

Abstract: A high output, narrow band thermally energized radiation source comprises a rare earth oxide radiator member that has a cross-sectional dimension in the range of five to thirty micrometers, the rare earth oxide radiator member, when heated to about 1700°C, having a concentrated radiated flux over the 400-2500 nanometer wavelength range such that at least 50% of the radiated flux is within a spectra band that is less than 400 nanometers wide.

公开(公告)号：EP0166229A3

公开(公告)日：1986-03-12

申请号：EP85106441

申请日：1985-05-24

Applicant: MANNESMANN Aktiengesellschaft

Inventor： Kolz, Helmut, Dipl.-Ing. ,  Ettwig, Hans, Dipl.-Phys., Dr.

IPC: G01J05/52

CPC classification number: G01J5/08 ,  G01J5/0044 ,  G01J5/02 ,  G01J5/029 ,  G01J5/0818 ,  G01J5/0887 ,  G01J5/52 ,  G01J2005/063

Abstract: Bei einem Verfahren zum pyrometrischen Messen der wahren Temperatur mit Emissionsausgleich durch Zustrah len und Mehrfachreflexion ist im Abstand von der Meßgut oberfläche eine Ergänzungsfläche (2) mit einer Meßöffnung (3) angeordnet, durch die ein Meßstrahl der Optik eines Pyrometers (4) zugeführt wird.

公开(公告)号：WO1993024815A1

公开(公告)日：1993-12-09

申请号：PCT/SE1993000465

申请日：1993-05-26

Applicant: AGEMA INFRARED SYSTEMS AB ,  KARLSSON, Lars ,  HANDBERG, Ulf

Inventor： AGEMA INFRARED SYSTEMS AB

IPC: G01J05/52

CPC classification number: H04N3/09 ,  G01J5/52 ,  G01J5/522 ,  H04N5/33

Abstract: Arrangement for calibration of at least one radiation-sensitive detector means, whereby the arrangement comprises an aperture (90), and at least one reference body (50, 60, 600) which emits radiation with a measurable intensity. The arrangement further comprises a deflection member (160, 170, 620) which deflects radiation from the reference body, and at least one radiation-sensitive detector means (30) which detects the radiation value and generates an output signal dependent on the detected radiation value. The deflection member is arranged to reproduce the aperture (90) on the reference body (50, 60, 600) and the deflection member (160, 170, 620) deflects the radiation such that the midpoint of the reproduction of the aperture (90) remains on substantially the same surface of the reference body (50, 60, 600) during that time period in which the detector means receives radiation which is transmitted from the reference body and which passes through the aperture (90).

Abstract translation: 用于校准至少一个辐射敏感检测器装置的装置，由此该装置包括孔（90）以及以可测量的强度发射辐射的至少一个参考体（50,60,600）。 该装置还包括偏转来自参考体的辐射的偏转构件（160,170,620）和至少一个检测辐射值并且根据检测到的辐射值产生输出信号的辐射敏感检测器装置（30） 。 偏转构件被布置成在基准体（50,60,600）上再现孔（90），并且偏转构件（160,170,620）使辐射偏转，使得孔（90）的再现中点， 在检测器装置接收从参考体传送并穿过孔（90）的辐射的那段时间期间，残留在参考体（50,60,600）的基本相同的表面上。

公开(公告)号：WO1993024814A1

公开(公告)日：1993-12-09

申请号：PCT/SE1993000457

申请日：1993-05-25

Applicant: AGEMA INFRARED SYSTEMS AB ,  HAMRELIUS, Torbjörn ,  GULDEVALL, Ulf

Inventor： AGEMA INFRARED SYSTEMS AB

IPC: G01J05/52

CPC classification number: H04N5/33 ,  G01J5/52

Abstract: The invention relates to an arrangement for recording an IR-image of an object, comprising a focal plane array (FPA) (18) of IR-detectors and an optic (1-7) which images the object on the focal plane IR-detector array. At least one temperature reference (10, 11) is arranged in the beam path to the focal IR-detector array. At least one IR-reference detector (12, 13) is allotted to reference purposes among the IR-detector elements in this array. Each temperature reference is coordinated with at least one of the IR-reference detector elements, so that each of the IR-reference detector elements is impinged upon by radiation deriving essentially solely from one of the temperature references. An IR-detector reference output signal is intended to be produced for each temperature reference. Each IR-reference output signal is intended to set an individual reference level for the output signals from the remaining IR-detector elements in the IR-detector array.

Abstract translation: 本发明涉及一种用于记录物体的红外图像的装置，包括红外检测器的焦平面阵列（FPA）（18）和在焦平面红外检测器上成像物体的光学器件（1-7） 阵列。 至少一个温度参考（10,11）布置在聚焦红外探测器阵列的光束路径中。 在该阵列中的IR检测器元件中，分配至少一个IR参考检测器（12,13）以用于参考。 每个温度参考与IR参考检测器元件中的至少一个协调，使得每个IR参考检测器元件基本上仅基于温度参考之一导出的辐射照射。 将为每个温度参考产生IR检测器参考输出信号。 每个IR参考输出信号旨在为来自IR-检测器阵列中的其余IR检测器元件的输出信号设置单独的参考电平。

公开(公告)号：WO1991004471A1

公开(公告)日：1991-04-04

申请号：PCT/GB1990001383

申请日：1990-09-07

Applicant: THE SECRETARY OF STATE FOR DEFENCE IN HER ... ,  LUDLOW, John, Herbert

Inventor： THE SECRETARY OF STATE FOR DEFENCE IN HER ...

IPC: G01J05/52

CPC classification number: G01J5/522

Abstract: A thermal imager testing device (10) incorporates a pattern plate (32) with patterns (P0, P1, P2 and P3) cut through it. Patterns (P0 and P1) are of like spatial frequency, whereas patterns (P2 and P3) have respective relatively higher spatial frequencies. The patterns (P0 to P3) are like structured and like oriented, and they underlie blackbodies (34, 26, 28 and 30) respectively. Temperature differentials between the blackbodies (34 and 26 to 30) are maintained at constant values by temperature control circuits. The temperature of blackbody (34) is adjustable. The pattern plate (32) and underlying blackbodies are viewed by a thermal imager under test. The temperature of the blackbody (34) is adjusted until pattern (P0) is just discernable as cold relative to the pattern plate (32). If the thermal imager performance is acceptable patterns (P1 to P3) are then just discernable as hot relative to the pattern plate (32).

公开(公告)号：WO1990001686A1

公开(公告)日：1990-02-22

申请号：PCT/US1989003151

申请日：1989-07-20

Applicant: HUGHES AIRCRAFT COMPANY

Inventor： HUGHES AIRCRAFT COMPANY ,  GRINBERG, Jan ,  WELKOWSKY, Murray, S.

IPC: G01J05/52

CPC classification number: G01J5/10 ,  G01J5/20 ,  G01J5/22 ,  G01J5/522

Abstract: An infrared (IR) simulator is disclosed in which an array of pixels is defined on an insulative substrate by resistor bridges which contact the substrate at spaced locations and are separated from the substrate, and thereby thermally insulated therefrom, between the contact locations. Semiconductor drive circuits on the substrate enable desired current flows through the resistor bridges in response to input control signals, thereby establishing the appropriate IR radiation from each of the pixels. The drive circuits and also at least some of the electrical lead lines are preferably located under the resistor bridges. A thermal reflector below each bridge shields the drive circuit and reflects radiation to enhance the IR output. The drive circuits employ sample and hold circuits which produce a substantially flicker-free operation, with the resistor bridges being impedance matched with their respective drive circuits. The resistor bridges may be formed by coating insulative base bridges with a resistive layer having the desired properties, and overcoating the resistive layers with a thermally emissive material. The array is preferably formed on a silicon-on-sapphire (SOS) wafer.

Abstract translation: 公开了一种红外（IR）模拟器，其中像素阵列通过电阻器桥限定在绝缘衬底上，电阻器桥在间隔开的位置处接触衬底，并且在接触位置之间与衬底分离，从而与衬底隔离。 衬底上的半导体驱动电路响应于输入控制信号使期望的电流流过电阻器桥，从而从每个像素建立适当的红外辐射。 驱动电路以及至少一些电引线优选位于电阻桥下。 每个桥下的热反射器屏蔽驱动电路并反射辐射以增强IR输出。 驱动电路采用产生基本上无闪烁操作的采样和保持电路，其中电阻器桥与它们各自的驱动电路阻抗匹配。 可以通过用具有期望特性的电阻层涂覆绝缘基桥来形成电阻器桥，并用热发射材料覆盖电阻层。 阵列优选形成在蓝宝石（SOS）硅晶片上。