Abstract:
Apparatus for monitoring the temperature of a high voltage conductor includes an electrically and thermally conductive fixture for attachment to a high voltage conductor, and a high voltage insulator having a high voltage end and a reference potential end. The insulator is connected at the high voltage end to the fixture. The insulator contains a fiber optic cable in a fiber optic cable passageway from the reference potential end to the high voltage end. The cable extends beyond the insulator. An optical temperature sensor head is optically coupled to the cable the high voltage end. The sensor head includes a sensor crystal which transmits light that varies with temperature of the sensor crystal. An electrically and thermally conductive enclosure enclosing the sensor head is supported in the fixture for thermally conductive contact with the high voltage conductor effective to couple the temperature of the high voltage conductor to the sensor crystal. An optoelectrical unit powers and detects the optic signal carrying the information about the temperature of the high voltage conductor.
Abstract:
Use of an optical fiber for the direct receipt of heat radiation for transmission to a remote pyrometer is enabled by the provision of an apertured, contaminant free compartment in the component being heated, and aligning the heat receiving end of the optical fiber with the aperture so as to receive radiated heat from within the compartment.
Abstract:
A temperature sensor for measuring a temperature of a substrate in a thermal processing chamber is described. The chamber includes a reflector forming a reflecting cavity with a substrate when the substrate is positioned in the chamber. The temperature sensor includes a probe having an input end positioned to receive radiation from the reflecting cavity, and a detector optically coupled to an output end of the probe. The radiation entering the probe includes reflected radiation and non-reflected radiation. The detector measures an intensity of a first portion of the radiation entering the probe to generate a first intensity signal and measures an intensity of a second portion of the radiation entering the probe to generate a second intensity signal. The detector is configured so that a ratio of the reflected radiation to the non-reflected radiation is higher in the first portion than the second portion. The two intensity signals are used to calculate the temperature and emissivity of the substrate.
Abstract:
A method and system for measuring the distribution of the energy field density of a laser beam is provided. Laser pulses of the laser beam are extracted in groups or individually from the laser beam, are locally separated from one another, and the respective distribution of the energy field density of the deflected and locally separated individual laser pulses is measured.
Abstract:
A semiconductor device that is capable of correctly transferring signals at high speed. The semiconductor device includes a semiconductor chip, a light-receiving element formed in the semiconductor chip for receiving an optical signal, and a glass fiber as an optical signal transfer device connected to the light-receiving element for transferring the optical signal into the semiconductor chip. Optical signals have a smaller attenuation of signal amplitude and have a higher transfer speed compared to electrical signals. Therefore, by transferring signals in the form of optical signals, the semiconductor device that can correctly transfer signals at high speed is obtained.
Abstract:
A method and system for identifying and calculating the percentages of gases, such as the automotive and other commercial refrigerant gases, in a gas mixture using infrared spectroscopy is disclosed. The novel system is compact, relatively inexpensive and has greater accuracy than those systems of the prior art.
Abstract:
A detector with a wide detecting range having a module of electrical circuit boards including an infrared radiation detector element; a stacked-up multifaceted arc lens assembly installed in front of the detector element which is located at the focus of the arc lens assembly to receive the focused infrared rays; and a single deflector plate conjoined to the detector element and mounted on the electrical circuit board, the signal deflector plate having symmetrically constructed reflecting units. Each reflecting unit is composed of a least two reflection planes. The invention is capable of covering detection blind zone exceeding 60 degrees both in right and left directions of the central axis of the detector element, thereby achieving a wide detecting range of over 200 degrees. A method of extending the detecting range is also taught.
Abstract:
An uncooled thermal matrix detector having a given spectral sensitivity range and being formed from pixels which are thermally insulated from each other, each pixel including an absorbing element which is thermosensitive in the spectral sensitivity range. The thermal matrix detector also includes on its face, turned toward the incident radiation to be detected, of each thermosensitive absorbing element, a biperiodic grating of elementary blocks limiting the viewing angle of the detector, the pitch of the grating being less than the mean wavelength of the spectral sensitivity range. The thermal matrix detector can be applied to so-called BLIP uncooled thermal detectors.
Abstract:
A portable, infrared, multiple gas analyzer for measuring the concentration of a plurality of infrared absorbent gases with a simple optical arrangement for transmitting an infrared beam along an optical path along with gas mixtures to be analyzed. Light transmitting tubes arranged in a U-like configuration transmit infrared energy and the gases applied thereto over a small path to an infrared detector from an infrared source and provide electrical analog output signals representative of the detected gases. The detector output signals are processed by D.C. processing circuits including an analog to digital converter and microprocessing circuits for providing digital, binary coded, output signals representative of the detected gas concentration of the infrared absorbent gases. The analyzer can be readily calibrated by applying a non-infrared absorbent gas to the gas analyzer to provide a maximum output signal level with the infrared beam on and the background level or dark level signal with the beam off. The gas mixture having the infrared absorbent gases to be measured are applied to the analyzer for measurement and the resulting analog signals are amplified under control of a microprocessor for determining whether or not a preselected signal level stored in the microprocessor memory is exceeded or not. If not, the gain of the amplifier is increased to compensate for the aging of the analyzer. An offset voltage is applied to the analog to digital converter under control of the microprocessor to the amplified gas signals for increasing the resolution of the converter output signals only during the time intervals the absorbent gases are being measured. The microprocessor is programmed to execute a program for calculating the detected concentration of the gases undergoing analysis based on the previously acquired and stored “zero” gas level, dark level and known gas factors to provide the desired digital, binary coded, gas concentration signal from the analyzer.
Abstract:
A temperature sensor for measuring a temperature of a substrate in a thermal processing chamber is described. The chamber includes a reflector forming a reflecting cavity with a substrate when the substrate is positioned in the chamber. The temperature sensor includes a probe having an input end positioned to receive radiation from the reflecting cavity, and a detector optically coupled to an output end of the probe. The radiation entering the probe includes reflected radiation and non-reflected radiation. The detector measures an intensity of a first portion of the radiation entering the probe to generate a first intensity signal and measures an intensity of a second portion of the radiation entering the probe to generate a second intensity signal. The detector is configured so that a ratio of the reflected radiation to the non-reflected radiation is higher in the first portion than the second portion. The two intensity signals are used to calculate the temperature and emissivity of the substrate.