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公开(公告)号:EP3222997A4
公开(公告)日:2017-11-29
申请号:EP15860167
申请日:2015-11-18
Inventor: SUGANUMA HIROSHI , OKUNO TAKUYA , MOTOMURA ASAKO , AKIEDA SHIZUKA , TSUJI MANAMI , OKINA YUNA , SUGIYAMA YOKO , AIBA KAZUHIRO , LIU LI
IPC: G01N21/359 , G01N21/47
CPC classification number: G01N21/255 , G01J3/42 , G01N17/004 , G01N21/01 , G01N21/359 , G01N21/4738 , G01N2021/0106 , G01N2201/10 , G01N2201/129 , G06F17/30247 , G06K9/00147 , G06K9/0055 , G06N99/005 , G06T2207/30024
Abstract: A quality evaluation method includes an acquisition step of acquiring spectral data related to transmitted light or diffusely reflected light from a cell mass by irradiating the cell mass with measurement light including near-infrared light, and an evaluation step of evaluating quality of the cell mass, based on the spectral data of the cell mass acquired in the acquisition step.
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公开(公告)号:EP3290984A4
公开(公告)日:2018-04-25
申请号:EP16786240
申请日:2016-03-22
Applicant: SUMITOMO ELECTRIC INDUSTRIES
Inventor: SUGANUMA HIROSHI , OKUNO TAKUYA , OKINA YUNA , MOTOMURA ASAKO , SUGIYAMA YOKO
CPC classification number: G01J3/2823 , G01J3/0208 , G01J3/108 , G01N21/27 , G01N21/359 , G01N33/487 , G01N2201/0633 , G02B13/22 , G02B21/0064 , G02B21/0096 , G02B21/02 , G02B21/06 , G02B21/365
Abstract: Provided is a microscope device which includes: (1) a light source (10) that outputs illumination light in a wavelength band including a near-infrared region; (2) an illumination optical system (30) that irradiates an observation target (90) with the illumination light output from the light source; (3) an image formation optical system (40) that includes a spectroscopic unit which is configured to receive and disperse transmitted or scattered light produced at the observation target by irradiating the observation target with the illumination light, and that forms an image on the basis of the dispersed transmitted or scattered light; and (4) an image capturing unit (50A) that acquires the image formed by the image formation optical system. An illumination-light-irradiated area of the observation target is larger than an area of the field of view of the image formation optical system (40), and is less than or equal to ten times the area of the field of view.
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