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    SPECTROSCOPY DEVICE, RAMAN SPECTROSCOPIC MEASUREMENT DEVICE, AND SPECTROSCOPY METHOD
    1.
    发明公开
    SPECTROSCOPY DEVICE, RAMAN SPECTROSCOPIC MEASUREMENT DEVICE, AND SPECTROSCOPY METHOD 审中-公开

    公开(公告)号：EP4534963A1

    公开(公告)日：2025-04-09

    申请号：EP22943848.6

    申请日：2022-12-19

    Applicant: Hamamatsu Photonics K.K.

    Inventor： TSUCHIYA Kunihiko ,  IKEMURA Kenichiro

    IPC: G01J3/36 ,  G01J3/44 ,  G01N21/65

    Abstract: A spectroscopic device 5 receives light L1 wavelength-resolved in a predetermined direction by a spectroscopic optical system 4 including a spectroscopic element to output spectroscopic spectrum data of the light L1, and the spectroscopic device includes a pixel unit 11 including a plurality of pixels 21 receiving the wavelength-resolved light L1 to convert the light into an electrical signal, and the plurality of pixels 21 being arranged in a row direction along a wavelength resolution direction and in a column direction perpendicular to the row direction, a conversion unit 12 converting the electrical signal from the plurality of pixels 21 into a number of photons, and a generation unit 13 integrating the number of photons of a plurality of pixels 21 belonging to the same column to generate spectroscopic spectrum data based on an integration result.

    LIGHT DETECTION DEVICE, LIGHT DETECTION SYSTEM, AND FILTER ARRAY
    2.
    发明公开
    LIGHT DETECTION DEVICE, LIGHT DETECTION SYSTEM, AND FILTER ARRAY 审中-公开

    公开(公告)号：EP4492103A1

    公开(公告)日：2025-01-15

    申请号：EP23766648.2

    申请日：2023-02-28

    Applicant: Panasonic Intellectual Property Management Co., Ltd.

    Inventor： KOMMA Yoshiaki ,  YAKO Motoki

    IPC: G02B5/26 ,  G01J3/26 ,  G01J3/36 ,  G02B5/28 ,  H04N25/10

    Abstract: A light detection device (300) includes a filter array (10) and an image sensor (50). The filter array includes filters including a first filter and a second filter. The image sensor includes pixels and detects light transmitted through the filter array. A first transmission spectrum of the first filter having local maxima differs from a second transmission spectrum of the second filter having local maxima. The filters are arranged in a matrix pattern along a first direction and a second direction crossing each other. The pixels are arranged in a matrix pattern along a third direction and a fourth direction crossing each other. At least one of Rp1 and Rp2 differs from 1. The Rp1 is a quotient obtained by dividing a pitch of the filters in the first direction by a pitch of the pixels in the third direction. The Rp2 is a quotient obtained by dividing a pitch of the filters in the second direction by a pitch of the pixels in the fourth direction.

    IMAGING UNIT AND MEASUREMENT DEVICE
    4.
    发明公开
    IMAGING UNIT AND MEASUREMENT DEVICE 审中-公开

    公开(公告)号：EP4443120A2

    公开(公告)日：2024-10-09

    申请号：EP24195594.7

    申请日：2021-01-04

    Applicant: Hamamatsu Photonics K.K.

    Inventor： NAKAMURA, Tomonori

    IPC: G01J3/36

    CPC classification number: G01N21/9501 ,  G01N21/8422 ,  G01J3/36

    Abstract: A measurement apparatus includes an inclined dichroic mirror configured to separate light from a sample by transmitting or reflecting the light according to wavelengths, and have an edge shift width, which is a width of a wavelength band in which the transmittance and the reflectance change according to a change in wavelength, having a predetermined width, a total reflection mirror configured to reflect one part of light either transmitted or reflected by the inclined dichroic mirror, an imaging element configured to photograph the other part of the light transmitted or reflected by the inclined dichroic mirror in a first imaging region and photograph light reflected by the total reflection mirror in a second imaging region different from the first imaging region, and a control apparatus configured to correct images photographed in the first imaging region and the second imaging region based on optical characteristics related to a change in transmittance and reflectance with respect to a wavelength in the inclined dichroic mirror.

    DEVICES, SYSTEMS, AND METHODS FOR ANALYZING MEASUREMENT OBJECTS
    10.
    发明公开
    DEVICES, SYSTEMS, AND METHODS FOR ANALYZING MEASUREMENT OBJECTS 审中-公开

    公开(公告)号：EP4198465A3

    公开(公告)日：2023-06-28

    申请号：EP22214129.3

    申请日：2022-12-16

    Applicant: Aikemy GmbH

    Inventor： ISHIZAKI, Kotaro ,  ISHIZAKI-SROKA, Agata

    IPC: G01J3/02 ,  G01J3/28 ,  G01J3/36 ,  G01J3/42

    Abstract: A device (10) for analyzing a sample (12) comprising: a measurement area (16) at which the sample (12) is to be located; an illumination arrangement (18) including at least one illumination source for illuminating the measurement area (16) with illumination (19) such that the illumination (19) is incident on the sample (12); and a spectral sensing arrangement (20) including: a first spectral sensor (22) configured to perform a spectral measurement of the sample (12) in response to the incident illumination (19) so as to produce spectral measurement data, and a second spectral sensor (24) configured to perform a spectral measurement of the sample (12) in response to the incident illumination (19) so as to produce spectral measurement data, characterized in that the spectral sensing arrangement (20) is deployed such that each of the first (22) and second (24) spectral sensors is oriented toward the measurement area (16) so as to collect illumination (23, 25) arriving from the measurement area (16).

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