IMPROVED RAMAN SPECTROSCOPY SYSTEM
    1.
    发明申请

    公开(公告)号:US20180299328A1

    公开(公告)日:2018-10-18

    申请号:US15578757

    申请日:2016-06-01

    Applicant: SERSTECH AB

    Abstract: A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.

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