公开(公告)号：US20240427133A1

公开(公告)日：2024-12-26

申请号：US18340273

申请日：2023-06-23

Applicant: Thermo Electron Scientific Instruments LLC

Inventor： Min Yan ,  William Bayer ,  William Keefe

IPC: G02B21/26 ,  G02B21/28

Abstract: A removably insertable detector module for a spectroscope. An example microscope system includes a microscope plate, a plurality of posts fix-mounted to the microscope plate, and a detector module removably mounted to the microscope plate. The posts align the detector module with respect to the microscope plate. The detector module includes a detector base plate, a detector fix-mounted on the detector base plate, and an optical element fix-mounted on the detector base plate. The optical element is configured to receive a light and direct the light to the detector.

公开(公告)号：US12019014B2

公开(公告)日：2024-06-25

申请号：US17812512

申请日：2022-07-14

Applicant: Thermo Electron Scientific Instruments LLC

Inventor： William Robert Keefe ,  Gang Feng ,  Min Yan ,  William Bayer ,  Peter Steinberg

IPC: G01N21/35 ,  G01L1/22 ,  G01N21/3563

CPC classification number: G01N21/3563 ,  G01L1/22 ,  G01N2201/0634

Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.

公开(公告)号：US20230194346A1

公开(公告)日：2023-06-22

申请号：US18084249

申请日：2022-12-19

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

Inventor： Alexander GRENOV ,  Min Yan ,  Mike Bradley

IPC: G01J3/28 ,  G01J3/02 ,  G01N21/359

CPC classification number: G01J3/2823 ,  G01J3/0237 ,  G01N21/359 ,  G01N2201/127 ,  G01N2021/3595

Abstract: Methods and systems for automatically adjusting a sample position in a spectrometer, such as a Fourier-transform infrared (FTIR) spectrometer, are described. The sample may be automatically positioned using an auto-focusing procedure. For example, images including an aperture marker are acquired by directing light towards the sample via an aperture. The sample position may be adjusted based on features extracted from the aperture marker images.

公开(公告)号：US20240210313A1

公开(公告)日：2024-06-27

申请号：US18181236

申请日：2023-03-09

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

Inventor： Michael Bradley ,  Min Yan

IPC: G01N21/35

CPC classification number: G01N21/35

Abstract: An absolute transmission accessory for a spectrometer. One example spectrometer system includes a base plate, a light source configured to transmit light, and an interferometer mounted to the base plate. The interferometer receives the light from the light source and output modulated light. The spectrometer system includes a first optical element configured to receive the modulated light and direct the modulated light, and a second optical element configured to receive the modulated light and focus the modulated light to a sample compartment. The spectrometer system includes a detector compartment including one or more detectors, the detector compartment configured to receive light from the sample compartment. The spectrometer system includes a sample holder coupled to the base plate. The modulated light is directed to the sample holder, and light exiting the sample holder is directed through the sample compartment and to the detector compartment via the second optical element.

公开(公告)号：US20230016495A1

公开(公告)日：2023-01-19

申请号：US17812512

申请日：2022-07-14

Applicant: Thermo Electron Scientific Instruments LLC

Inventor： William Robert Keefe ,  Gang Feng ,  Min Yan ,  William Bayer ,  Peter Steinberg

IPC: G01N21/3563 ,  G01L1/22

Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.