Abstract:
A piezo-TFT cantilever microelectromechanical system (MEMS) and associated fabrication processes are provided. The method comprises: providing a substrate, such as glass for example; forming thin-films overlying the substrate; forming a thin-film cantilever beam; and simultaneously forming a TFT within the cantilever beam. The TFT is can be formed least partially overlying a cantilever beam top surface, at least partially overlying a cantilever beam bottom surface, or embedded within the cantilever beam. In one example, forming thin-films on the substrate includes: selectively forming a first layer with a first stress level; selectively forming a first active Si region overlying the first layer; and selectively forming a second layer overlying the first layer with a second stress level. The thin-film cantilever beam is formed from the first and second layers, while the TFT source/drain (S/D) and channel regions are formed from the first active Si region.
Abstract:
A spring has a fixed end and a free end, the free end when elevated to a specific elevation from the fixed end produces a load on an object. A spring constant of the spring is calculated, a load correction amount for correcting load of the spring is calculated using the spring constant, and the spring based on the load correction amount.
Abstract:
The invention relates to optical devices for measuring pressure or force, comprising an clectromagnetic radiation source, and a pressure membrane or a spiral spring which has a surface that at least partially reflects the electromagnetic rays of the electromagnetic radiation source. The inventive devices are especially characterized in that they allow, inter alia, measurement of even the slightest pressure changes of fluids and other flowable materials in the stationary and/or flowing state or even the slightest mechanical deformations on spiral springs. In order to do this, the rays of an electromagnetic radiation source are incident on the at least partially reflective surface of the pressure membrane or spiral spring. At least one section of a stationarily located body or of a stationarily located body having a reflective layer is disposed in the path of the reflected rays, upstream of a photodetector for said rays, and projects into said rays. A mechanical modification causes the reflected rays to be absorbed, diffracted, reflected again and/or split to a higher or lesser extent by the body.
Abstract:
The invention concerns a tensile testing sensor mounted on a mechanical member wherein forces to be measures develop comprising a bendable metal blade (1, 22) provided with measuring gauges (2, 23) implanted and positioned on the blade. Said blade (1, 22) is sensitive to mechanical tensile and compressive deformations sustained and transmitted via two bearing parts (4, 5, 20) coupled to the mechanical member wherein the forces develop. The sensor is equipped with a mechanically locking flange (31) placed during calibration between the bearing parts (4, 5, 20) and the sensor blade.
Abstract:
Solid state dual leaf spring transducers are fabricated by batch photolithographic etching techniques from a monocystalline nonmetallic material, such as silicon. Each leaf spring structure includes a leaf spring portion surrounded by a support structure defined by an intervening region of the wafer disposed between adjacent leaf spring structures etched into the wafer. A pair of such leaf spring structures with their respective surrounding support structures are joined together in mutually opposed relation to form a composite dual leaf spring transducer structure of the type wherein a pair of leaf spring structures are mechanically coupled together in axially spaced relation along an axis of sensitivity for equal displacement along said axis of sensitivity in response to displacement of either one of the spring structures relative to the support structure. In one embodiment, a third wafer is interposed between the first two opposed wafers, such third wafer having apertures formed therein so that the leaf spring structures are coupled together through the apertures in the third wafer. In another embodiment, conductive capacitive patterns are formed on the leaf spring structures so as to provide a capacitor structure for sensing displacement of the leaf spring structure.
Abstract:
A load cell of the beam type comprising an operator member having a pair of parallel longitudinally extending slots forming a central beam member and a pair of parallel bearing members spaced outwardly of the central beam member, the outer ends of the bearing members and the central beam member being integral. The operator member has a pair of support members extending outwardly from opposite sides thereof, the support members being positionable on horizontal laterally spaced surfaces on a support block. The load or force to be measured is applied to the central portion of the central beam member which is provided with deflection measuring apparatus at points of inflection of the elastic curve of a beam member. The deflection measuring apparatus preferably comprises an indicator arm extending perpendicularly from the central beam member such that the end of the indicator arm is moved a substantial distance upon slight angular deflection of the elastic curve or the neutral axis of the central beam member to indicate the magnitude of force applied to deflect the beam member.
Abstract:
A force-to-signal converter having a device for receiving an external force, a device for transmitting the external force, a third device for converting the external force delivered from the second-mentioned device into a corresponding deflection, and a device for converting the deflection obtained from the thirdmentioned device into a signal, in which the third-mentioned device is a substantially E-shaped spring.