Abstract:
An integrated metrology module includes a chuck for holding a sample and positioning the sample with respect to an optical metrology device, a reference chip for the optical metrology device, the reference chip being movable to various positions with respect to the optical metrology device, and a reference chip purge device provides a flow of purge gas or air over the reference chip while the reference chip is in the various positions. The reference chip purge device may be static or movable with the reference chip.
Abstract:
The invention encompasses analyzers and analyzer systems that include a single molecule analyzer, methods of using the analyzer and analyzer systems to analyze samples, either for single molecules or for molecular complexes. The single molecule uses electromagnetic radiation that is translated through the sample to detect the presence or absence of a single molecule. The single molecule analyzer provided herein is useful for diagnostics because the analyzer detects single molecules with zero carryover between samples.
Abstract:
An infusion set and an intravenous bag adapter constructed of ultraviolet transmissive thermoplastic are used in spectroscopic validation of pharmaceuticals. The described hardware allows for qualitative and quantitative assurance of medications and is used to prevent medication errors. The thermoplastic is transmissive in the range below 315 nanometers. In one embodiment, the invention comprises a spectrometer and a test chamber that are unaffected by the presence of ambient light. The spectrometer includes an unshielded slot or receptacle into which the test chamber is easily fitted. This embodiment can function well in drug diversion programs for which unused post-op narcotics can be tested.
Abstract:
An inspection device for use in a fluid container having at least an opening includes a housing sized to fit through the opening. The housing has at least two fluid flow channels extending therethrough, each having an inlet and an outlet, and a pump maintained in the housing within each fluid flow channel. The pumps are selectively controlled to maneuver the housing within the fluid container. The inspection device continues with a method of in-situ inspection of a container having at least one opening to receive a fluid, that includes up-loading a virtual model of the container into a computer, inserting the device into the container, generating a position signal by the device and receiving the position signal on a computer. A virtual image of the device in the virtual model of the container is generated to determine an actual position of the device within the container.
Abstract:
The invention generally relates to analytical and monitoring systems useful for analyzing and measuring cells and biological sample. More particularly, the invention relates to a unique cell counting chamber, e.g., a thin gap fluidic cell chamber for both bright field and fluorescent imaging of bacteria or parasites, and methods for making the same.
Abstract:
Natural and/or synthetic antibodies for specific proteins are adhered to nanoparticles. The nanoparticles are adhered to a substrate and the substrate is exposed to a sample that may contain the specific proteins. The substrates are then tested with surface enhanced Raman scattering techniques and/or localized surface plasmon resonance techniques to quantify the amount of the specific protein in the sample.
Abstract:
The present disclosure provides a contamination resistant sensor port which includes one or more sealing members positioned so as to limit and/or prevent internal contamination of the sensor port with fluids and/or particles present in the environment outside the sensor port.
Abstract:
A system for inspecting a backside surface of a wafer with multi-channel focus control includes a set of inspection sub-systems including a first inspection sub-system positioned and an additional inspection sub-system. The first and additional inspection sub-systems include an optical assembly, an actuation assembly, where the optical assembly is disposed on the actuation assembly, and a positional sensor configured to sense a position characteristic between a portion of the optical assembly and the backside surface of the wafer. The system also includes a controller configured to acquire one or more wafer profile maps of the backside surface of the wafer and adjust a first focus position of the first inspection sub-system or an additional focus position of the additional inspection sub-system based on the received one or more wafer profile maps.
Abstract:
Particle collecting unit for the detection of particles in the particle level of substance without evaporating the collected particles is disclosed. The particle collecting unit, which is preferably disposable, comprises a body, a duct extending through the body and connecting between a rear opening of the body and an air intake orifice of the body, and an aperture or slit in a mid portion of the body adapted for receiving a removable sampling member into a position within the duct, wherein the particles collecting unit is configured to be removably coupled to a vacuum generator with said rear opening of the body coupled to an air intake opening of the vacuum generator. A sampling probe for use with the particle collecting unit is also disclosed. The invention further refers to a system based on the particle collecting unit for the detection of particles in the particle level of substance without evaporating the collected particles is also disclosed, and to a method of detection based on the system.
Abstract:
A microscope including a sample carrier configured to support a sample. Excitation light illuminates the sample via an excitation beam path, Detection light from the sample is guided to detection means via a detection beam oath. Through an objective arranged along the optical axis, excitation light is guided in direction of the sample carrier and detection light coming from the sample is guided in direction of the detection means. Beam-splitting means separate excitation light and detection light. Also provided are means for generating a light sheet from excitation tight, and means for illuminating the sample with this light sheet. The light sheet lies in a plane at a nonzero angle to the optical axis. The means for illuminating the sample include an optical-deflecting device arranged on or at the sample carrier, which deflects excitation light from the objective into the plane of the light sheet via an optically active surface.