公开(公告)号：US06686582B1

公开(公告)日：2004-02-03

申请号：US09530612

申请日：2000-08-07

Applicant: Martin Völcker ,  Jürgen Liegel ,  Martin Gulch

Inventor： Martin Völcker ,  Jürgen Liegel ,  Martin Gulch

IPC: H01J314

CPC classification number: G01N21/6452 ,  B01L3/5085 ,  B01L2300/0829 ,  G01N21/253 ,  G01N21/6456 ,  G01N2201/024

Abstract: An optical system made up of lens arrays and normal lenses is particularly suitable for use as a massive parallel reader (approximately 102 channels) for microtiter plates and the like in absorption, fluorescence and luminescence.

Abstract translation: 由透镜阵列和普通透镜构成的光学系统特别适用于吸收，荧光和发光中用于微量滴定板等的大型平行读取器（大约10 2通道）。

公开(公告)号：US06677579B2

公开(公告)日：2004-01-13

申请号：US09920311

申请日：2001-08-03

Applicant: Johann Engelhardt

Inventor： Johann Engelhardt

IPC: H01J314

CPC classification number: G02B21/008 ,  G02B21/0072 ,  G02B21/0084

Abstract: A method and an apparatus for phase correction of position and detection signals in scanning microscopy. The method includes generation of a position signal from the position of a beam deflection device (7) and generation, from the light (17) proceeding from the specimen (15), of a detection signal pertinent to the position signal. The position signal and detection signal are then transferred to a processing unit (23). In the processing unit (23), a correction value is determined. The correction value is transferred to a computer (34) to compensate for time differences between the position signal and detection signal.

Abstract translation: 一种用于扫描显微镜中位置和检测信号的相位校正的方法和装置。 该方法包括从光束偏转装置（7）的位置产生位置信号，并从与样本（15）进行的光（17）产生与位置信号相关的检测信号。 然后，位置信号和检测信号被传送到处理单元（23）。 在处理单元（23）中，确定校正值。 校正值被传送到计算机（34）以补偿位置信号和检测信号之间的时间差。

公开(公告)号：US06642504B2

公开(公告)日：2003-11-04

申请号：US09814197

申请日：2001-03-21

Applicant: Wade Thomas Cathey, Jr.

Inventor： Wade Thomas Cathey, Jr.

IPC: H01J314

CPC classification number: G02B27/0025 ,  G02B21/004 ,  G02B21/0084

Abstract: An improved confocal microscope utilizes an array of light sources imaged onto an object, and an array of small detectors to detect the light from each source. Cross talk between the beams of light is prevented by temporally modulating the sources at different frequencies. Light from one source is temporally modulated at a first frequency, for example in the megahertz region. A reference signal at the same frequency plus an offset frequency is also sent to the detector assigned to that source. The detected signal and the reference signal are then beat together, and heterodyne detection is used to detect only the light from the assigned source, which will beat with the reference signal and produce a signal at the offset frequency. Light from other sources beat with the reference signal to produce different frequency beat signals, which are filtered out using bandpass filters.

公开(公告)号：US06635864B2

公开(公告)日：2003-10-21

申请号：US09905277

申请日：2001-07-13

Applicant: B. Mark Hirst

Inventor： B. Mark Hirst

IPC: H01J314

CPC classification number: H04N1/053 ,  H04N1/1135 ,  H04N2201/02439 ,  H04N2201/0471 ,  H04N2201/04732 ,  H04N2201/04744 ,  H04N2201/04768 ,  H04N2201/04793 ,  H04N2201/04794

Abstract: A method for determining a scan line error for a scan line, wherein the scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device. The method comprises the steps of (a) determining a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet, and (b) determining from the difference, a scan line error for the scan line produced from the first facet.

Abstract translation: 一种用于确定扫描线的扫描线误差的方法，其中扫描线由扫描装置的旋转反射器的多个面中的一个产生。 该方法包括以下步骤：（a）确定从第一面产生的扫描线中的点的发生时间与从第二面产生的扫描线中的点的出现时间之间的差异，以及 （b）根据该差异确定从第一面产生的扫描线的扫描线误差。

公开(公告)号：US06563109B1

公开(公告)日：2003-05-13

申请号：US09726298

申请日：2000-11-27

Applicant: Jürgen Kösters

Inventor： Jürgen Kösters

IPC: H01J314

CPC classification number: G01L3/12 ,  G01L3/242

Abstract: The present invention provides an apparatus for optoelectronically determining power for a moving machine element. The apparatus includes two parallel coding discs which are mounted on the machine element and each have grid lines or light windows distributed over their circumference. A light source is arranged on one side of the coding discs and has an associated light meter on the opposite side of the discs. The light source and the light meter are preferably of an annular design in order to transilluminate all the light windows to a largely uniform degree. A diffusion disc is arranged in the beam path between the light source and the coding discs and a light barrier is mounted outside the region of the light windows. At least one of the light windows on one of the coding discs is formed in the beam path of the light barrier and a translucent endless zone is formed on the other of the parallel coding discs.

Abstract translation: 本发明提供了一种用于光电确定移动机器元件的功率的装置。 该装置包括两个平行编码盘，它们安装在机器元件上，并且每个具有分布在其圆周上的网格线或光窗口。 光源设置在编码盘的一侧，并且在光盘的相对侧上具有相关联的光度计。 光源和光计优选为环形设计，以便将所有的光窗透光到大致均匀的程度。 扩散盘布置在光源和编码盘之间的光束路径中，并且光栅被安装在光窗口的区域的外部。 其中一个编码盘上的光窗中的至少一个形成在光栅的光束路径中，并且在另一个并行编码盘上形成半透明的环形区。

公开(公告)号：US06552331B2

公开(公告)日：2003-04-22

申请号：US09923703

申请日：2001-08-06

Applicant: Christian Rotsch

Inventor： Christian Rotsch

IPC: H01J314

CPC classification number: G01Q30/025 ,  G01Q40/00 ,  G03F1/84 ,  Y10S977/869

Abstract: An apparatus and method for imaging and scanning masks for semiconductor production includes placing a scanning instrument having a probe at a position to scan a layer side of a mask with the probe, placing an optical microscope on a side of the mask opposite the layer side at a position to image a detail of the mask from the side of the mask opposite the layer side, positioning the scanning instrument and the optical microscope relative to each other such that the optical microscope images the probe and the mask simultaneously, and laterally displacing the mask between and relative to the scanning instrument and the optical microscope to permit selection of an imaged detail of the mask while a relative position between the scanning instrument and the optical microscope is maintained. A selected detail of the mask is imaged and/or scanned.

公开(公告)号：US06518564B1

公开(公告)日：2003-02-11

申请号：US09601370

申请日：2000-09-07

Applicant: Christof Steiner ,  Rainer Ochs

Inventor： Christof Steiner ,  Rainer Ochs

IPC: H01J314

CPC classification number: G01T1/2014

Abstract: The invention relates to a method and a device for reading out radiation image information stored on an image medium (12). A scanning unit (10) has a laser (16) for scanning the image medium (12) with a readout light beam (22). The read/processing device (14) functions with two channels so that the luminescent light emitted by the image medium (12) during scanning and also the reflected read-out light are synchronously detected, evaluated and correlated. The digital luminescent light image values are corrected according to the digital reflection light values in order to better obtain the radiation image information.

Abstract translation: 本发明涉及一种用于读出存储在图像介质（12）上的辐射图像信息的方法和装置。 扫描单元（10）具有用读取光束（22）扫描图像介质（12）的激光器（16）。 读/处理装置（14）具有两个通道的功能，使得在扫描期间由图像介质（12）发射的发光光以及反射的读出光同步地被检测，评估和相关。 根据数字反射光值校正数字荧光光图像值，以便更好地获得辐射图像信息。

公开(公告)号：US06486462B1

公开(公告)日：2002-11-26

申请号：US09853417

申请日：2001-05-10

Applicant: Mark Rumer

Inventor： Mark Rumer

IPC: H01J314

CPC classification number: G02B6/2931 ,  G02B6/29311 ,  G02B6/29314 ,  G02B6/29373 ,  G02B6/29383 ,  G02B6/29395

Abstract: An optical add/drop multiplexer to be tuned locally or remotely, to compensate for drift in operation, and to facilitate installation or replacement at remote terminals.

Abstract translation: 本地或远程调谐的光分插复用器，以补偿操作中的漂移，并便于远程终端的安装或更换。

公开(公告)号：US06483101B1

公开(公告)日：2002-11-19

申请号：US09457513

申请日：1999-12-08

Applicant: Steven Webster

Inventor： Steven Webster

IPC: H01J314

CPC classification number: H01L27/14627 ,  G02B7/02 ,  G02B7/022 ,  H01L24/73 ,  H01L24/97 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14636 ,  H01L27/14683 ,  H01L27/14685 ,  H01L31/0203 ,  H01L31/0232 ,  H01L31/02325 ,  H01L2224/32013 ,  H01L2224/32225 ,  H01L2224/48227 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2924/15787 ,  H01L2924/181 ,  H04N5/2251 ,  H04N5/2253 ,  H04N5/2254 ,  H04N5/2257 ,  Y10T29/49002 ,  H01L2924/00 ,  H01L2924/00012

Abstract: An image sensor package includes an image sensor, a window, and a molding, where the molding includes a lens holder extension portion extending upwards from the window. The lens holder extension portion includes a female threaded aperture extending from the window such that the window is exposed through the aperture. A lens is supported in a threaded lens support. The threaded lens support is threaded into the aperture of the lens holder extension portion. The lens is readily adjusted relative to the image sensor by rotating the lens support.

Abstract translation: 图像传感器封装包括图像传感器，窗口和模制件，其中模制件包括从窗户向上延伸的透镜保持器延伸部分。 透镜保持器延伸部分包括从窗口延伸的阴螺纹孔，使得窗口通过孔露出。 透镜支撑在螺纹透镜支架中。 带螺纹的透镜支撑件被拧入透镜保持器延伸部分的孔中。 通过旋转透镜支架，相对于图像传感器容易地调节透镜。

公开(公告)号：US06476381B1

公开(公告)日：2002-11-05

申请号：US09443051

申请日：1999-11-18

Applicant: Won Ho Jhe ,  Ki Hyun Kim

Inventor： Won Ho Jhe ,  Ki Hyun Kim

IPC: H01J314

CPC classification number: B81C1/0046 ,  B82Y10/00 ,  B82Y40/00 ,  G03F7/0002 ,  H01L21/6715

Abstract: A nano-pattern lithographic fabrication apparatus for fabricating a fine pattern using a pulled micro-pipette is disclosed. This apparatus includes a container for receiving a certain solution therein, a container controlling unit for controlling the movement of the container and an ejection of the solution filled in the container, a sample moving unit for supporting and moving the sample, a detector for detecting a distance between the container controlling unit and the sample moving unit, and a controlling unit for receiving a detection signal from the detector and controlling the movement of the container and the sample moving unit and a distance therebetween.

Abstract translation: 公开了一种使用拉动的微量移液管制造精细图案的纳米图案平版印刷制造装置。 该装置包括用于容纳一定溶液的容器，用于控制容器的移动和填充在容器中的溶液的排出的容器控制单元，用于支撑和移动样品的样品移动单元， 容器控制单元和样品移动单元之间的距离，以及用于从检测器接收检测信号并控制容器和样品移动单元的移动以及它们之间的距离的控制单元。